NIST logo

Publications Portal

You searched on:
Author: Lee Richter

Displaying records 1 to 10 of 86 records.
Resort by: Date / Title


1. Vertically Segregated Structure and Properties of small molecule-polymer blend semiconductors for organic thin film transistors
Published: 8/27/2012
Authors: Nayool Shin, Dean M DeLongchamp, Jihoon Kang, Regis J Kline, Lee J Richter, Vivek M Prabhu, Balaji Purushothamanc, John E Anthony, Do Y Yoon
Abstract: The phase-segregated structure and the electrical properties of thin film blends of the small-molecule semiconductor fluorinated 5,11-bis(triethylsilylethynyl) anthradithiophene with insulating binder polymers were studied for organic thin film trans ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906842

2. 3-Aminopropyltriethoxysilane Functionalization and Biotinylation of 4H-SiC for Immobilization of Streptavidin
Published: 6/1/2012
Authors: Elissa Heather Williams, Albert Davydov, John A Schreifels, Mulpuri V. Rao, Abhishek Motayed, Siddarth Sundaresan, Peter Bocchini, Lee J Richter, Gheorghe Stan, Kristen L Steffens, Rebecca A Zangmeister
Abstract: (0001) 4H-SiC was functionalized with 3-aminopropyltriethoxysilane (APTES) and subsequently biotinylated for the immobilization of streptavidin. Atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), ellipsometry, fluorescence microsc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909389

3. A synchrotron beamline for extreme-ultraviolet photoresist testing
Published: 9/30/2011
Authors: Charles S Tarrio, Steven E Grantham, Shannon Bradley Hill, Nadir Sabirovich Faradzhev, Lee J Richter, Chester Knurek, Thomas B Lucatorto
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be evaluated for sensitivity and tested to ensure that they will not contaminate the scanner optics. The new NIST facility described here provides data on the contami ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908231

4. Molecular Order in High-Efficiency Polymer/Fullerene Bulk Heterojunction Solar Cells
Published: 9/22/2011
Authors: Matthew R. Hammond, Regis J Kline, Andrew A Herzing, Lee J Richter, David Germack, Hyun W. Ro, Christopher L Soles, Daniel A Fischer, Tao Xu, Luping Yu, Michael F. Toney, Dean M DeLongchamp
Abstract: We report quantitative measurements of ordering, molecular orientation, and nanoscale morphology in the active layer of bulk heterojunction organic photovoltaic cells based on a thieno[3,4-b]thiophene-alt-benzodithiophene copolymer (PTB7), which has ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908836

5. The NIST EUV facility for advanced photoresist qualification using the witness-sample test
Published: 8/29/2011
Authors: Steven E Grantham, Charles S Tarrio, Shannon Bradley Hill, Lee J Richter, Thomas B Lucatorto, J. van Dijk, C. Kaya, N. Harned, R. Hoefnagels, M. Silova, J. Steinhoff
Abstract: Before being used in an extreme-ultraviolet (EUV) scanner, photoresists must first be qualified to ensure that they will not excessively contaminate the scanner optics or other parts of the vacuum environment of the scanner. At the National Institute ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908029

6. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Published: 5/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Madelaine Herminia Hernandez, Andrew A Herzing, Lee J Richter, Christina Ann Hacker, Joseph J Kopanski, Jan Obrzut, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908437

7. Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors
Published: 3/21/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Christina Ann Hacker, Jan Obrzut, Lee J Richter, Curt A Richter
Abstract: In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908435

8. Controlling the Microstructure of Solution-Processible Small Molecules in Thin-Film Transistors through Substrate Chemistry
Published: 2/4/2011
Authors: Regis J Kline, Steven D Hudson, Xinran Zhang, David J Gundlach, Andrew Moad, Lee J Richter, Oana Jurchescu, Thomas Jackson, Sanker Subramanian, John E Anthony, Michael F. Toney
Abstract: Solution-processible small molecules have tremendous potential for providing both high charge carrier mobility and low cost processing. This study outlines a detailed microstructural study of the effect of substrate chemistry on fluorinated 5,11-bis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906810

9. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

10. Origin of Nanoscale Variations in Photoresponse of an Organic Solar Cell
Published: 4/22/2010
Authors: Behrang H Hamadani, Suyong S. Jung, Paul M Haney, Lee J Richter, Nikolai B Zhitenev
Abstract: Photo generated charge transport in bulk heterojunction (BHJ) solar cells is strongly dependent on the active layer nanomorphology resulting from phase segregation and connectivity of the donor and acceptor regions. Scanning probe-based techniques an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903445



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series