NIST logo

Publications Portal

You searched on:
Author: Thomas Renegar

Displaying records 1 to 10 of 37 records.
Resort by: Date / Title


1. NIST SURFACE ROUGHNESS AND STEP HEIGHT CALIBRATIONS, Measurement Conditions and Sources of Uncertainty
Published: 3/18/2014
Authors: Theodore Vincent Vorburger, Thomas B Renegar, Xiaoyu A Zheng, Jun-Feng Song, Johannes A Soons, Richard M Silver
Abstract: NIST methods for calibration of surface roughness parameters and step height are described. The surface roughness parameters currently being measured include roughness average (Ra), root mean square (rms) roughness (Rq), average maximum height of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915207

2. Applications of Surface Metrology in Firearm Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a tool comes into contact with a surface an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914401

3. Applications of Surface Metrology in Toolmark Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

4. The Effect of Tip Size in Calibration of Surface Roughness Specimens with Rectangular Profiles
Published: 9/2/2013
Authors: Jun-Feng Song, Thomas B Renegar, Johannes A Soons, Balasubramanian Muralikrishnan, John S Villarrubia, Xiaoyu A Zheng, Theodore Vincent Vorburger
Abstract: For the calibration of rectangular and trapezoidal profile roughness specimens, stylus tip will increase profile peak width and decrease valley width, which may cause the Ra changes (either increase or decrease, depends on the profile shape). Someti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911850

5. International Comparison of Surface Roughness, APMP.L-K8
Published: 6/17/2013
Authors: Andrew Baker, Siew-Leng Tan, Richard Leach, Lena Jung, Seung Yin Wong, Anusorn Tonmueanwai, Kazuya Naoi, Jaewan Kim, Thomas B Renegar, K P Chaudhary, Louise Mostert, Mohamed Amer, Sitian Gao, Chin-Lung Tsai, Ngo Ngoc Anh, Augustinus Drijarkara
Abstract: Surface roughness calibration services of sixteen countries from four metrology regions are compared through measurements of roughness and step height standards. The artefacts circulated include three steps of nominal depths 0.4 μm, 2.4 μ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911023

6. Topography Measurements and Performance Comparisons between NIST SRM 2460 Standard Bullet Masters and BKA Bullet Replicas
Published: 7/31/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Susan M Ballou, Xiaoyu A Zheng, Thomas B Renegar, Richard M Silver
Abstract: Two Standard Reference Material (SRM) 2460 Bullets produced by the National Institute of Standards and Technology (NIST) were used as masters for the fabrication of replica bullets at the Bundeskriminalamt (BKA). The surface topography of the SRM ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908222

7. Development of Ballistics Identification ‹ From Image Comparison to Topography Measurement in Surface Metrology-
Published: 3/22/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, James H Yen, Richard M Silver, Wei Chu
Abstract: Fired bullets and ejected cartridge cases have unique ballistics signatures left by the firearm. By analyzing the ballistics signatures, forensic examiners can trace these bullets and cartridge cases to the firearm used in a crime scene. Current au ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908043

8. Stylus Tip-Size Effect on the Calibration of Periodic Roughness Specimens with Rectangular Profiles
Published: 3/21/2012
Authors: Thomas B Renegar, Johannes A Soons, Balasubramanian Muralikrishnan, John S Villarrubia, Xiaoyu A Zheng, Theodore Vincent Vorburger, Jun-Feng Song
Abstract: Stylus instruments are widely used for surface characterization. It is well known that the size and shape of the stylus tip affects the measured surface geometry and parameters. In most cases, increasing the tip size decreases the measured Ra value b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911079

9. The National Ballistics Imaging Comparison (NBIC) Project
Published: 3/10/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Robert Meryln Thompson, James H Yen, Thomas B Renegar, Xiaoyu A Zheng, Richard M Silver, Martin Ols
Abstract: In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907871

10. An Iterative Algorithm for Calculating Stylus Radius Unambiguously
Published: 9/24/2011
Authors: Theodore Vincent Vorburger, Xiaoyu A Zheng, Thomas B Renegar, Jun-Feng Song, Li Ma
Abstract: The stylus radius is an important specification for stylus instruments and is commonly provided by instrument manufacturers. However, it is difficult to measure the stylus radius unambiguously. Accurate profiles of the stylus tip may be obtained by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907724



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series