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Author: Craig Shakarji

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1. An improved L1 based algorithm for standardized planar datum establishment
Published: 10/1/2014
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: This paper has two major goals. First, we present an algorithm for establishing planar datums suitable for a default in tolerancing standards. The algorithm is based on a constrained minimization search based on the L_1 (L1) norm after forming a conv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916075

2. In-situ Temperature Calibration Capability for Dimensional Metrology
Published: 7/28/2014
Authors: Prem Kumar Rachakonda, Daniel S Sawyer, Balasubramanian Muralikrishnan, Christopher J Blackburn, Craig M Shakarji, Gregory F Strouse, Steven David Phillips
Abstract: The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) has the capability to perform large range dimensional measurements in a facility, called the Tape Tunnel. The Tape Tunnel is equipped with a 60 m l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915733

3. Common-Path Method for Laser Tracker Ranging Calibration
Published: 3/31/2014
Authors: Christopher J Blackburn, Daniel S Sawyer, Craig M Shakarji
Abstract: We present an alternative to the back-to-back method of testing laser tracker ranging systems. Our approach uses a common air path for both the measurement and reference laser beams. This technique allows for more accurate determination of the refere ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914077

4. Metrological challenges introduced by new tolerancing standards
Published: 2/13/2014
Authors: Edward P Morse, Yue Peng, Vijay Srinivasan, Craig M Shakarji
Abstract: The recent release of ISO has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity [2]. However, these tools also bring new challenges ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916214

5. Theory and Algorithms for L1 Fitting Used for Planar Datum Establishment in Support of Tolerancing Standards
Published: 10/15/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for establishing a datum plane consistent with ASME Y14.5 standard definitions corresponding to a planar datum feature sampled with coordinate data that is weighted,. The method uses a one-sided minimization searc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913789

6. On the Enduring Appeal of Least-squares Fitting in Computational Coordinate Metrology
Published: 9/6/2013
Authors: Vijay Srinivasan, Craig M Shakarji, Edward P Morse
Abstract: The vast majority of points collected with coordinate measuring machines are not used in isolation; rather, collections of these points are associated with geometric features through fitting routines. In manufacturing applications, there are two fund ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907559

7. Theory and Algorithms for Weighted Total Least-Squares Fitting of Lines, Planes, and Parallel Planes to Support Tolerancing Standards
Published: 8/16/2013
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present the theory and algorithms for fitting a line, a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912180

8. Metrological Challenges Introduced by New Tolerancing Standards
Published: 7/5/2013
Authors: Edward P Morse, Yue Peng, Vijay Srinivasan, Craig M Shakarji
Abstract: The recent release of ISO 14405-1 has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity. However, these tools also bring new challe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916211

9. Fitting Weighted Total Least-Squares Planes and Parallel Planes to Support Tolerancing Standards
Published: 10/19/2012
Authors: Craig M Shakarji, Vijay Srinivasan
Abstract: We present elegant algorithms for fitting a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems is reduced to a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911379

10. Performing three dimensional measurements on micro-scale features using a flexible CMM fiber probe with ellipsoidal tip
Published: 1/5/2012
Authors: Balasubramanian Muralikrishnan, Jack A Stone Jr, Craig M Shakarji, John Richard Stoup
Abstract: The tip of a traditional CMM probe used for measurements of macro-scale artifacts is generally a sphere of excellent geometry. Its known diameter (from a prior calibration) and form along with the known approach direction (which is normal to the surf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909420



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