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You searched on: Author: John Dagata

Displaying records 1 to 10 of 66 records.
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1. Method for Measuring the Volume of Nominally 100 um Diameter Spherical Water-in-Oil Emulsion Droplets
Series: Special Publication (NIST SP)
Report Number: 260-184
Published: 7/13/2016
Authors: John A Dagata, Natalia Farkas, John A Kramar
Abstract: This report describes an equivalent volume measurement method using optical microscopy for estimating the mean volume of nominally 100 um diameter spherical droplets. The droplets are the aqueous phase of proprietary water in oil emulsions used i ...

2. Method for measuring the diameter of polystyrene latex reference spheres by atomic force microscopy
Series: Special Publication (NIST SP)
Report Number: 260-185
Published: 6/30/2016
Authors: John A Dagata, Premsagar Purushotham Kavuri, Andras Vladar, Kensei Ehara, Natalia Farkas, Chung-Lin Wu, Hiroshi Itoh
Abstract: This report presents a correlated height and width measurement model for particle size analysis of spherical particles by atomic force microscopy (AFM). It is complementary to more familiar methods based on a single value of the particle height o ...

3. Development of the Metrology and Imaging of Cellulose Nanocrystals
Published: 9/19/2011
Authors: Michael T Postek, Andras Vladar, John A Dagata, Natalia Farkas, Bin Ming, Ryan Wagner, Arvind Raman, Robert J Moon, Ronald Sabo, Theodore H Wegner, James Beecher
Abstract: The development of metrology for nanoparticles is a significant challenge. Cellulose nanocrystals (CNC) are one group of nanoparticles that have high potential economic value but present substantial challenges to the development of the measurement ...

4. High-voltage Nanoimprint Lithography of Refractory Metal Film
Published: 7/1/2010
Authors: John A Dagata, Natalia Farkas, R Ramsier
Abstract: Local oxidation of metal, semiconductor, and polymer surfaces has provided a common basis from which to explore fundamental principles of nanolithography and prototype functional nanostructures for many years now. This article summarizes an investiga ...

5. Cellulose Nanocrystals the Next Big Nano-thing?
Published: 8/6/2008
Authors: Michael T Postek, Andras Vladar, John A Dagata, Natalia Farkas, Bin Ming, Ronald Sabo, Theodore H Wegner
Abstract: Biomass surrounds us from the smallest alga to the largest redwood tree. Even the largest trees owe their strength to a newly-appreciated class of nanomaterials known as cellulose nanocrystals (CNC). Cellulose, the world s most abundant natural, rene ...

6. Physical characterization methods for iron-oxide contrast agents encapsulated within a targeted liposome-based delivery system
Published: 4/16/2008
Authors: John A Dagata, Natalia Farkas, Cindi L Dennis, Robert D Shull, Vincent A Hackley, Charles W Yang, Kathleen F Pirollo, Esther H Chang
Abstract: Intact liposome-based targeted nanoparticle delivery systems (NDS) are immobilized by nonselective binding and characterized by scanning probe microscopy (SPM) in a fluid imaging environment. The size, size distribution, functionality, and stability ...

7. Characterization of Prototype Silicon Pitch Artifacts Fabricated by Scanning Probe Lithography and Anisotropic Wet Etching
Published: 1/1/2005
Authors: F S Chien, W F Hsieh, S Gwo, Jay Shi Jun, Richard M Silver, Andras Vladar, John A Dagata

8. Current, Charge, and Capacitance During Scanning Probe Oxidation. I. Maximum Charge Density and Lateral Diffusion
Published: 8/15/2004
Authors: John A Dagata, F Perez-murano, C Martin, H Kuramochi, H Yokoyama
Abstract: A comprehensive analysis of the electrical current passing through the tip-substrate junction during oxidation of silicon by scanning probe microscopy (SPM) is presented. This analysis of experimental results under dc-bias conditions resolves the rol ...

9. Current, Charge, and Capacitance During Scanning Probe Oxidation. II Electrostatic and Meniscus Forces Acting on Cantilever Bending
Published: 8/1/2004
Authors: John A Dagata, F Perez-murano, C Martin, H Kuramochi, H Yokoyama

10. Metrology Development for the Nanoelectronics Industry at the National Institute of Standards and Technology
Published: 3/7/2004
Authors: Joaquin (Jack) Martinez, John A Dagata, Curt A Richter, Richard M Silver
Abstract: The National Institute of Standards and Technology has provided and continues to provide critical metrology development for the semiconductor manufacturing industry as it moves from the microelectronic era into the nanoelectronic era. This presentaio ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series