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You searched on: Author: Quandou Wang

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1. Holographic radius test plates for spherical surfaces with large radius of curvature
Published: 7/9/2014
Authors: Quandou (Quandou) Wang, Ulf Griesmann, Johannes A Soons
Abstract: We describe a novel interferometric method, based on nested Fresnel zone lenses or photon sieves, for testing and measuring the radius of curvature of precision spherical surfaces that have radii in a range between several meters to few hundred meter ...

2. Figure metrology for x-ray focusing mirrors with Fresnel holograms and photon sieves
Published: 6/20/2014
Authors: Ulf Griesmann, Johannes A Soons, Quandou (Quandou) Wang, Lahsen Assoufid
Abstract: We report on interferometric measurements of the figure error of an ultra-precise mirror with the shape of an elliptical toroid for the diffraction limited focusing of hard x-rays from an undulator x-ray source. We describe measurement configuratio ...

3. A versatile bilayer resist for laser lithography at 405 nm on glass substrates
Published: 10/23/2013
Authors: Quandou (Quandou) Wang, Ulf Griesmann
Abstract: We describe a simple bilayer photoresist that is particularly well suited for laser lithography at an exposure wavelength of 405 nm on glass substrates, which is often used for the fabrication of binary diffractive optics and computer generated holog ...

4. Holographic Radius Test Plates
Published: 9/7/2013
Authors: Quandou (Quandou) Wang, Johannes A Soons, Ulf Griesmann
Abstract: We evaluate a method for testing the radius of spheres with a hologram that consists of a pair of nested Fresnel zone lenses. The hologram is positioned in the collimated test beam of a Fizeau interferometer. The inner zone lens generates a focus at ...

5. A modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers
Published: 8/17/2012
Authors: Jungjae Park, Lingfeng Chen, Quandou (Quandou) Wang, Ulf Griesmann
Abstract: We describe a method to simultaneously measure thickness variation and refractive index homogeneity of 300 mm diameter silicon wafers using a wavelength shifting Fizeau interferometer operating at 1550 nm. Only three measurements are required, corres ...

6. Plasma Etching Uniformity Control for Making Large and Thick Dual-Focus Zone Plates
Published: 8/1/2011
Authors: Lei Chen, Quandou (Quandou) Wang, Ulf Griesmann
Abstract: A typical zone plate structure is composed of concentric rings with a radially decreasing feature size such that the path of light through every second zone to the focus differs by one optical wavelength. In order to achieve the highest possible diff ...

7. Binary amplitude holograms made from dyed photoresist
Published: 5/13/2011
Authors: Quandou (Quandou) Wang, Ulf Griesmann, John H Burnett
Abstract: A method for fabricating binary amplitude holograms from a dyed photoresist is described. It is of particular interest for holograms that are used as null lenses in the form metrology of aspheric surfaces and wavefronts. A pigment that stron ...

8. Plasma Etching Uniformity Control for Making Large and Thick Dual-Focus Zone Plates
Published: 1/11/2011
Authors: Lei Chen, Quandou (Quandou) Wang, Ulf Griesmann
Abstract: In summary, an optimized plasma etching process has been developed and a Teflon ring has been made to minimize the feature size variation effect and eliminate the thick glass edge effect. Large phase type dual-focus zone plate with good etching profi ...

9. Spatially resolved height response of phase-shifting interferometers measured using a patterned mirror with varying spatial frequency
Published: 9/1/2010
Authors: JiYoung Chu, Quandou (Quandou) Wang, John Lehan, Ulf Griesmann
Abstract: In the performance evaluation of phase-shifting interferometers for figure metrology, the height response, or height transfer function, is rarely taken into consideration, because in most applications smooth surfaces are measured and only the lowest ...

10. Flatness measurements of thin, plane-parallel optics floated on a heavy liquid
Published: 6/23/2010
Authors: Ulf Griesmann, Quandou (Quandou) Wang, Eric C Benck, Jiyoung Chu, Jaewoong Sohn
Abstract: no abstract

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