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You searched on: Author: Jason Killgore

Displaying records 1 to 10 of 21 records.
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1. Detection of Atomic Force Microscopy Cantilever Displacement with a Transmitted Electron Beam
Published: 7/29/2016
Authors: Ryan B Wagner, Taylor J Woehl, Robert R Keller, Jason Philip Killgore
Abstract: Cantilever motion in atomic force microscopy (AFM) systems is typically measured with an optical lever system. The response time of AFM cantilevers can be decreased by reducing the size of the cantilever; however, the fastest AFM cantilevers are ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920462

2. Photothermally excited force modulation microscopy for broadband nanomechanical property measurements
Published: 11/18/2015
Authors: Ryan B Wagner, Jason Philip Killgore
Abstract: We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal actuation allows for an AFM cantilever driving ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919177

3. Broadband frequency-dependent material property measurements with the atomic force microscope
Published: 6/8/2015
Authors: Ryan B Wagner, Jason Philip Killgore
Abstract: The atomic force microscope (AFM) is a widely utilized instrument for measuring nanometer-scale variations in mechanical properties. Most AFM techniques only measure these properties at a single high frequency (e.g. hundreds of kHz on resonance) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918112

4. Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements
Published: 1/5/2015
Authors: Ryan Wagner, Jason Philip Killgore, Ryan C. Tung, Arvind Raman, Donna C. Hurley
Abstract: Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the eigenvalues, or resonant frequencies, of the AFM cantilever in contact to quantify local mechanical properties. However, the cantilever eigenmodes, or vibrational sh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915975

5. Characterizing the Free and Surface-Coupled Vibrations of Heated-Tip Atomic Force Microscope Cantilevers
Published: 8/6/2014
Authors: Jason Philip Killgore, Ryan C. Tung, Donna C. Hurley
Abstract: Combining heated-tip atomic force microscopy (HT-AFM) with quantitative methods for determining surface mechanical properties creates an avenue for nanoscale thermomechanical property characterization. For nanomechanical methods that employ an a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915425

6. Liquid Contact Resonance Atomic Force Microscopy Via Experimental Reconstruction of the Hydrodynamic Function
Published: 6/11/2014
Authors: Ryan C. Tung, Jason Philip Killgore, Donna C. Hurley
Abstract: We present an experimental method, based on analytical hydrodynamic theory, to accurately predict the inertial and viscous fluid loading forces at arbitrary frequencies in a contact resonance atomic force microscope system. Knowledge of the flui ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915745

7. Engineering Plant Cell Walls: Tuning Lignin Monomer Composition for Deconstructable Biofuels Feedstocks or Resilient Biomaterials
Published: 2/27/2014
Authors: Peter Ciesielski, Michael Resch, Barron Hewetson, Jason Philip Killgore, Alexandra E Curtin, Nick Anderson, Ann Chiaramonti Chiaramonti Debay, Donna C. Hurley, Aric Warner Sanders, Michael Himmel, Clint Chapple, Nathan Mosier, Bryon Donohoe
Abstract: Advances in genetic manipulation of the biopolymers that compose plant cell walls will facilitate more efficient production of biofuels and chemicals from biomass and lead to specialized biomaterials with tailored properties. Here we investigate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914543

8. SPRITE: A modernized approach to scanning probe contact resonance imaging
Published: 1/20/2014
Authors: Anthony B Kos, Jason Philip Killgore, Donna C. Hurley
Abstract: We describe a system for contact resonance tracking called Scanning Probe Resonance Image Tracking Electronics (SPRITE). SPRITE can image two contact resonance frequencies simultaneously and thus can be used to acquire quantitative mechanical prope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914785

9. Dynamic contact AFM methods for nanomechanical properties
Published: 12/1/2013
Authors: Donna C. Hurley, Jason Philip Killgore
Abstract: This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them fro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911068

10. Measurement of viscoelastic loss tangent with contact resonance modes of atomic force microscopy
Published: 11/26/2013
Authors: Donna C. Hurley, Sara E. Campbell, Jason Philip Killgore, Lewis M Cox, Yifu Ding
Abstract: We show how atomic force microscopy techniques based on contact resonance (CR) can be used to measure the viscoelastic loss tangent tan δ of polymeric materials. Absolute values of tan δ do not involve intermediate calculation of loss modul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914560



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