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Displaying records 11 to 20 of 125 records.
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11. AC-Mode SW-IR Radiation Thermometers for Measurement of Ambient Temperatures
Published: Date unknown
Authors: George P Eppeldauer, Howard W Yoon
Abstract: Recent improvements in the fabrication technology of short-wave infrared (SWIR) quantum detectors opened a new era in radiation thermometry. Ambient and higher temperatures can be measured with low uncertainties using thermoelectrically (TE) cooled e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841068

12. AC-mode SW-IR radiation thermometers for measurement of ambient temperatures
Published: 5/10/2007
Authors: George P Eppeldauer, Howard W Yoon
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104430

13. Absolute Flux Calibrations of Stars
Published: Date unknown
Authors: Gerald T Fraser, Steven W Brown, Howard W Yoon, Bettye C Johnson, Keith R Lykke
Abstract: Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega referenced against the Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30 years that offer the potential to impro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841110

14. Absolute spectral responsivity measurements of solar cells by a hybrid optical technique
Published: 7/15/2013
Authors: Behrang H Hamadani, John F Roller, Brian P Dougherty, Fiona Persaud, Howard W Yoon
Abstract: An irradiance mode, absolute differential spectral response measurement system for solar cells is presented. The system is based on combining the monochromator-based approach of determining the power mode spectral responsivity of cells with an LED-b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913725

15. Advances in Radiometry for Ocean Color
Published: 11/10/2003
Authors: Steven W Brown, D K Clark, Bettye C Johnson, Howard W Yoon, Keith R Lykke, S Flora, M Feinholz, N Souaidia, C Pietras, Thomas C Stone, M Yarbrough, Y S Kim, R Barnes, J Mueller
Abstract: Organic materials in the oceans have spectral signatures based on their light-scattering properties. These optical properties are related to bio-physical and bio-chemical data products, such as the concentration of phytoplankton chlorophyll-{alpha} ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840030

16. Assessment of the Accuracy of the MOBY Spectral Radiance Calibration Sources Using the SXR and the VXR
Published: 10/1/2000
Authors: Bettye C Johnson, Howard W Yoon, M Feinholz, D K Clark
Abstract: The Marine Optical Buoy (MOBY) and its related optical system the Marine Optical Sensor (MOS) consist of dual CCD-based spectrographs. MOBY, MOS, and other instruments operated by the MOBY team are used to provide in situ measurements of water-leavi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841511

17. CCPR-S1 Supplementary Comparison for Spectral Radiance in the range of 220 nm to 2500 nm
Published: 6/2/2009
Authors: Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles E Gibson, Howard W Yoon, Arnold A. Gaertner, Dieter Taubert, Juergen Hartmann
Abstract: In 1997, the Consultative Committee for Photometry and Radiometry (CCPR) initiated a supplementary comparison of spectral radiance in the wavelength range from 220 nm to 2500 nm (CCPR S1) using tungsten -strip filament lamps as transfer standards. Fi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900253

18. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published: 1/1/2003
Authors: Matthew A Davies, Howard W Yoon, T L Schmitz, T J Burns, M D Kennedy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103716

19. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published: 4/1/2000
Authors: Michael Kennedy, Matthew A. Davies, Howard W Yoon, Timothy J Burns
Abstract: A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821922

20. Calibrated Thermal Microscopy of the Tool-Chip Interface in Machining
Published: 8/1/2000
Authors: Howard W Yoon, Matthew A. Davies, Timothy J Burns, Michael Kennedy
Abstract: A critical parameter in predicting tool wear during machining and in accurate computer simulations of machining is the spatially-resolved temperature at the tool-chip interface. We describe the development and the calibration of a nearly diffraction- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841438



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