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Author: robert vest
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Displaying records 21 to 30 of 58 records.
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21. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

22. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

23. Present status of radiometric quality silicon photodiodes,
Published: 1/1/2003
Authors: R Korde, C Prince, D Cunningham, Robert Edward Vest, E Gullikson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101588

24. Quantum efficiency of solar-blind semiconductor photodiodes in the far ultraviolet,
Published: 1/1/2003
Authors: Robert Edward Vest, B Hertog, P P Chow
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101787

25. Response of a silicon photodiode to pulsed radiation,
Published: 1/1/2003
Authors: Robert Edward Vest, Steven E Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101786

26. Towards high accuracy reflectometry for extreme-ultraviolet lithography,
Published: 1/1/2003
Authors: Charles S Tarrio, Steven E Grantham, M B Squires, Robert Edward Vest, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101861

27. Absolute Extreme Ultraviolet Metrology
Published: 8/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham
Abstract: NIST has a long-standing program for the calibration of extreme ultraviolet optical components. Begun with the advent of the Synchrotron Ultraviolet Radiation Facility (SURF) almost 40 years ago, early activities centered on the development and char ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840110

28. AlGaN Schottky Diodes for Short-Wavelength UV Applications
Published: 6/1/2001
Authors: P P Chow, J J Klaassen, Robert Edward Vest, J M VanHove, A Wowchak, C Polley
Abstract: High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840131

29. The New Ultraviolet Spectral Responsivity Scale Based on Cryogenic Radiometry at Synchrotron Ultraviolet Radiation Facility III
Published: 5/1/2001
Authors: Ping-Shine Shaw, Thomas C Larason, R Gupta, Steven W Brown, Robert Edward Vest, Keith R Lykke
Abstract: The recently completed upgrade of the Synchrotron Ultraviolet Radiation Facility (SURF III) at the National Institute of Standards and Technology (NIST) has improved the accuracy of radiometric measurements over a broad spectral range from the infrar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841478

30. Absolute EUV Metrology,
Published: 1/1/2001
Authors: Charles S Tarrio, Robert Edward Vest, S Grantham
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100203



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