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Author: david seiler
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Displaying records 51 to 60 of 73 records.
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51. Optical Properties of Semiconductors
Published: 12/31/1994
Authors: Paul M. Amirtharaj, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29761

52. Optical Properties of Semiconductors
Published: 10/19/2009
Authors: David G Seiler, Stefan Zollner, Alain C. Diebold, Paul Amirtharaj
Abstract: Rapid advances in semiconductor manufacturing and associated technologies have increased the need for optical characterization techniques for materials analysis and in-situ monitoring/control applications. Optical measurements have many unique and at ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33124

53. Orbital and Spin Anisotropy of Conduction Electrons in InSb
Published: 12/31/1990
Authors: Chris L. Littler, I. T. Yoon, X. N. Song, W. Zawadzki, P. Pfeffer, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16203

54. Phonon-Assisted Magneto-Donor Optical Transitions in n-InSb
Published: 3/1/1990
Authors: Chris L. Littler, W. Zawadzki, M. R. Loloee, X. N. Song, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18665

55. Photoexcited Hot Electron Relaxation Processes in n-HgCdTe Through Impact Ionization Into Traps, Physics and Chemistry of Mercury Cadmium Telluride and Novel IR Detector Materials
Published: 6/1/1991
Authors: David G Seiler, J R. Lowney, Chris L. Littler, I. T. Yoon, M. R. Loloee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8386

56. Physics Careers in Government Agencies
Published: 3/14/2010
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905142

57. Proceedings of the Fourth International Conference on Materials and Process Characterization for VLSI
Published: 12/1/1997
Authors: X. F. Zong, David G Seiler, L. G. Song
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=17326

58. Quantum Conductance Fluctuations in a New Size-Scale Regime
Published: 5/5/1996
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4443

59. RII Spectroscopy of Trap Levels in Bulk and LPE Hg^d1-x^CdxTe
Published: 12/31/1993
Authors: Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=403

60. Scanning Capacitance Microscopy for Profiling PN-Junctions in Silicon
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Joseph J Kopanski, Jay F. Marchiando, J R. Lowney, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27180



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