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You searched on: Author: david seiler Sorted by: title

Displaying records 41 to 50 of 75 records.
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41. Magneto-Optical Investigation of Impurity and Defect Levels in HgCdTe Alloys
Published: 3/30/1990
Authors: Chris L. Littler, David G Seiler, M. R. Loloee

42. Magneto-Transport Properties of HgCdTe, EMIS Data Reviews
Published: 12/31/1994
Authors: J R. Lowney, Jin Soon Kim, David G Seiler

43. Mesoscopic Conductance Fluctuations in Large Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino

44. Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry
Published: 11/1/2006
Authors: David G Seiler, John S Suehle
Abstract: This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.

45. Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization
Published: 12/9/2007
Author: David G Seiler

46. Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published: 6/15/1993
Authors: Jin Soon Kim, David G Seiler, W. F. Tseng

47. Narrow-Gap Semiconductors and Related Materials
Published: 9/1/1990
Authors: David G Seiler, Chris L. Littler

48. National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Published: 8/1/2006
Authors: Michael T Postek, Richard R Cavanagh, C M Allocca, Douglas T Smith, Robert D Shull, David A Wollman, David G Seiler, Stephen Knight, A Diebold, Richard M Silver, Charles W Clark, Kevin W Lyons, James R Whetstone, Ronald F Boisvert

49. Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino, W. F. Tseng, W. Robert Thurber

50. Optical Characterization in Microelectronics Manufacturing
Series: Journal of Research (NIST JRES)
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler, William Duncan

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