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Displaying records 41 to 50 of 73 records.
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41. Mesoscopic Conductance Fluctuations in Large Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23051

42. Metrology in the Nanoelectronics Era: Collaborative Innovation Between NIST and Industry
Published: 11/1/2006
Authors: David G Seiler, John S Suehle
Abstract: This special article in Semiconductor International discusses NIST's role in metrology for the semiconductor industry as it moves to the nanoscale regime.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32487

43. Metrology, Nanocharacterization and Instrumentation for Emerging Nanotechnology and Nanoelectronics: Electrical and Optical Characterization
Published: 12/9/2007
Author: David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32866

44. Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published: 6/15/1993
Authors: Jin S. Kim, David G Seiler, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=10572

45. Narrow-Gap Semiconductors and Related Materials
Published: 9/1/1990
Authors: David G Seiler, Chris L. Littler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29974

46. National Nanotechnology Initiative Interagency Workshop on Instrumentation and Metrology for Nanotechnology Grand Challenge Report
Published: 8/1/2006
Authors: Michael T Postek, Richard R Cavanagh, C M Allocca, Douglas T Smith, Robert D Shull, David A Wollman, David G Seiler, Stephen Knight, A Diebold, Richard M Silver, Charles W Clark, Kevin W Lyons, James R Whetstone, Ronald F Boisvert
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822247

47. Novel Magnetic Field Characterization Techniques for Compound Semiconductor Materials and Devices
Published: 12/31/1995
Authors: Curt A Richter, David G Seiler, Joseph G. Pellegrino, W. F. Tseng, W. Robert Thurber
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2579

48. Optical Characterization in Microelectronics Manufacturing
Series: Journal of Research (NIST JRES)
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler, William Duncan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5728

49. Optical Characterization in Microelectronics Manufacturing
Published: 9/1/1994
Authors: S. Perkowitz, David G Seiler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32631

50. Optical Characterization of Materials and Devices for the Semiconductor Industry: Trends and Needs
Published: 12/31/1995
Authors: S. Perkowitz, David G Seiler, W M Bullis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9057