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You searched on: Author: david seiler Sorted by: date

Displaying records 51 to 60 of 75 records.
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51. Transverse Magnetoresistance: A Novel Two-Terminal Method for Measuring the Carrier Density and Mobility of a Semiconductor Layer
Published: 5/30/1994
Authors: J R. Lowney, W. Robert Thurber, David G Seiler

52. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman

53. Hg1-xCdxTe Characterization Measurements: Current Practice and Future Needs
Published: 12/31/1993
Authors: David G Seiler, Santos D Mayo, J R. Lowney

54. RII Spectroscopy of Trap Levels in Bulk and LPE Hg^d1-x^CdxTe
Published: 12/31/1993
Authors: Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G Seiler

55. Heavily Accumulated Surfaces of Mercury Cadmium Telluride Detectors: Theory and Experiment
Published: 7/1/1993
Authors: J R. Lowney, David G Seiler, W. Robert Thurber, Z. Yu, X. N. Song, Chris L. Littler

56. Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published: 6/15/1993
Authors: Jin Soon Kim, David G Seiler, W. F. Tseng

57. Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published: 6/1/1993
Authors: Nhan V Nguyen, Joseph G. Pellegrino, Paul M. Amirtharaj, David G Seiler, S. B. Qadri

58. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 8/1/1992
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey

59. Investigation of Mercury Interstitials in Hg^d1-2^CdxTe Alloys Using Resonant Impact-Ionization Spectroscopy
Published: 8/1/1992
Authors: Chris L. Littler, E. Maldonado, X. N. Song, Z. Yu, J. L. Elkind, David G Seiler, J R. Lowney

60. Intrinsic Carrier Concentration of Narrow-Gap Mercury Cadmium Telluride Based on the Nonlinear Temperature Dependence of the Bandgap
Published: 2/1/1992
Authors: J R. Lowney, David G Seiler, Chris L. Littler, I. T. Yoon

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series