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Author: steven phillips
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Displaying records 31 to 40 of 58 records.
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31. A Careful Consideration of the Calibration Concept
Published: 1/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M. Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824612

32. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606

33. Design and Testing of a One Dimensional Measuring Machine for Determining the Length of Ball Bars
Published: 1/1/2001
Authors: J C Ziegert, D Rea, Steven David Phillips, Bruce R. Borchardt
Abstract: A new machine for the rapid calibration of ball bars has been built.  By means of comparisons to CMM measurements, it has been shown to work as an accurate special purpose machine for the calibration of ball bar lengths.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823144

34. Precision Measurements in the New Millennium: Predictions, Opportunity and Progress
Published: 1/1/2001
Author: Steven David Phillips
Abstract: As the theme of this year''s International Dimensional Metrology Workshop is Dimensional Metrology - Precision Measurements in the New Millennium, it is interesting to consider the pervasiveness of dimensional metrology in our industrial soci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821589

35. Traceability Calibration, & Measurement Uncertainty Issues Regarding Coordinate Measuring Machines and Other Complex Instruments
Published: 6/1/2000
Author: Steven David Phillips
Abstract: The modern definition of traceability intimately links the concepts of calibration (i.e., connection to the SI unit) and measurement uncertainty. In a typical coordinate measuring machine (CMM) measurement problem the measurement under consideration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820969

36. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

37. A General Quantitative Method to Validate Instrument Calibration Techniques
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820940

38. Improving Kinematic Touch Trigger Probe Performance
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943

39. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820941

40. Measurement Uncertainty and Uncorrected Bias
Published: 1/1/1999
Authors: Steven David Phillips, K Eberhardt, William Tyler Estler
Abstract: This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820942



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