NIST logo

Publications Portal

You searched on:
Author: steven phillips
Sorted by: date

Displaying records 31 to 40 of 53 records.
Resort by: Date / Title

31. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...

32. A General Quantitative Method to Validate Instrument Calibration Techniques
Published: 11/1/1999
Author: Steven David Phillips
Abstract: In this paper a method to validate proposed calibration procedures for coordinate measuring machines (CMMs) is presented. Conceptually, the validation procedure is based on a computer generated population of CMMs assumed to include any real CMM that ...

33. Improving Kinematic Touch Trigger Probe Performance
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.

34. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...

35. Measurement Uncertainty and Uncorrected Bias
Published: 1/1/1999
Authors: Steven David Phillips, K Eberhardt, William Tyler Estler
Abstract: This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of ...

36. Calculation of Measurement Uncertainty Using Prior Information
Published: 11/1/1998
Authors: Steven David Phillips, William Tyler Estler
Abstract: We describe the use of Bayesian inference to include prior information about the value of the measurand in the calculation of measurement uncertainty. Typical examples show this can, in effect, reduce the expanded uncertainty by up to 85 %. The ...

37. The Estimation of Measurement Uncertainty of Small Circular Features Measured by Coordinate Measuring Machines
Published: 4/1/1998
Authors: Steven David Phillips, Bruce R. Borchardt, William Tyler Estler, J Buttress
Abstract: This paper examines the measurement uncertainty of small circular features as a function of the sampling strategy; i.e., the number and distribution of measurement points. Specifically, we examine measuring a circular feature using a three-point samp ...

38. Guidelines for Expressing the Uncertainty of Measurement Results Containing Uncorrected Bias
Published: 9/1/1997
Authors: Steven David Phillips, K Eberhardt, B Parry
Abstract: This paper proposes a method to extend the current ISO Guide to the Expression of Uncertainty in Measurement to include the case of known, but uncorrected, measurement bias. It is strongly recommended that measurement results be corrected for bias, h ...

39. Practical Aspects of Touch Trigger Probe Error Compensation
Published: 7/1/1997
Authors: William Tyler Estler, Steven David Phillips, Bruce R. Borchardt, Ted Hopp, M Levenson, K Eberhardt, Marjorie A McClain
Abstract: We present extensions of our prior work in modeling and correcting for pretravel variation errors in kinematic seat touch-trigger coordinate measuring machine (CMM) probes with straight styli. A simple correction term is shown to account for a range ...

40. Discussion of Statistical Issues in Geometric Feature Inspection Using Coordinate Measuring Machines
Published: 2/1/1997
Authors: Steven David Phillips, K Eberhardt
Abstract: A coordinate measuring machine (CMM) is a computer controlled device that uses a probe to obtain measurements on a manufactured part''s surface, usually one point at a time. Probe movements may be programmed or determined manually by operatio ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series