NIST logo

Publications Portal

You searched on: Author: steven phillips Sorted by: date

Displaying records 21 to 30 of 63 records.
Resort by: Date / Title

21. Uncertainty Due to Finite Resolution Measurements
Published: 5/1/2008
Authors: Steven David Phillips, Blaza Toman, William Tyler Estler

22. Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard
Published: 1/1/2007
Authors: Balasubramanian Muralikrishnan, Christopher J Blackburn, Daniel S Sawyer, Bruce R. Borchardt, William Tyler Estler, Steven David Phillips
Abstract: While the versatility and economics of laser trackers are quite appealing, the ability to assess their accuracy and to compare various brands has been limited by a lack of a national or international standard that encompasses testing and traceability ...

23. Laser Trackers: Testing and Standards
Published: 1/1/2007
Author: Steven David Phillips
Abstract: Laser trackers are now the tool of choice for large scale coordinate metrology.  They are transportable allowing reconfigurable production facilities at a lower capital cost than large CMMs.  Trackers now include absolute distance measuring ...

24. Large-Scale Metrology Instrument Performance Evaluations at NIST
Published: 1/1/2006
Authors: William Tyler Estler, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips
Abstract: The ASME B89 Committee on Dimensional Metrology has approved a new American National Standard B89.4.19 - Performance Evaluation of Laser Based Spherical Coordinate Measurement Systems. This Standard, to be published in 2006, specifies test methods fo ...

25. Recent Developments in the Standardization and Testing of Laser Trackers
Published: 1/1/2006
Authors: Daniel S Sawyer, Steven David Phillips, Bruce R. Borchardt, William Tyler Estler

26. Measurement Uncertainty, CMMs, and Standards: Today and the Future
Published: 1/1/2005
Author: Steven David Phillips
Abstract: Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an increasingly intertwined aspect of industrial metrology.  This paper examines the progressio ...

27. Measurement Uncertainty and Traceability Issues: A Standards Activity Update
Published: 1/1/2004
Author: Steven David Phillips

28. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...

29. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...

30. Measurement Uncertainty and Traceability Issues in National and International Measurements
Published: 5/1/2003
Author: Steven David Phillips
Abstract: This paper discusses some recent laboratory intercomparisons with emphasis on the success of the uncertainty statement to include the reference value. Some factors that affect this capability are discussed. Recently developed national and internation ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series