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Author: steven phillips
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Displaying records 21 to 30 of 56 records.
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21. Uncertainty Due to Finite Resolution Measurements
Published: 1/1/2004
Authors: Steven David Phillips, B Tolman, William Tyler Estler
Abstract: We investigate the influence of finite resolution on measurement uncertainty from a perspective of the Guide to the Expression of Uncertainty in Measurement (GUM). Finite resolution in the presence of Gaussian noise yields a distribution of results t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822244

22. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822066

23. Measurement Uncertainty and Traceability Issues in National and International Measurements
Published: 5/1/2003
Author: Steven David Phillips
Abstract: This paper discusses some recent laboratory intercomparisons with emphasis on the success of the uncertainty statement to include the reference value. Some factors that affect this capability are discussed. Recently developed national and internation ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822031

24. Recent Developments in Standards for Measurement Uncertainty and Traceability
Published: 5/1/2003
Author: Steven David Phillips
Abstract: This paper examines recent and future work of the B89.7 and ISO 14253 series of standards. Other recent online information on measurement uncertainty and traceability is also provided.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821747

25. The Validation of CMM Task Specific Measurement Uncertainty Software
Published: 1/1/2003
Authors: Steven David Phillips, Bruce R. Borchardt, A Abackerli, Craig M Shakarji, Daniel S Sawyer, P Murray, B Rasnick, K Summerhays, J M Baldwin, M P Henke
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822036

26. A Laser Tracker Calibration System
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

27. Some Developments at NIST on Traceability in Dimensional Measurements
Published: 10/1/2001
Authors: Dennis A Swyt, Steven David Phillips, J Palmateer
Abstract: This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821616

28. A Careful Consideration of the Calibration Concept
Series: Journal of Research (NIST JRES)
Published: 3/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823126

29. A Careful Consideration of the Calibration Concept
Published: 1/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M. Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824612

30. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606



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