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Author: simon kaplan
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Displaying records 31 to 40 of 77 records.
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31. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104518

32. Fourier transform refractometry
Published: 1/1/1998
Authors: Simon Grant Kaplan, Leonard M Hanssen, U Griesmann, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103915

33. Grain Boundary Induced Magneto-Far Infrared Resonances in Superconducting YBa^d2^Cu^d3^O^d7-δ^ Thin Films
Published: 1/1/1995
Authors: H-T S Lihn, E J Choi, Simon Grant Kaplan, H D Drew, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103974

34. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

35. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 11/1/2003
Authors: R Gupta, Simon Grant Kaplan
Abstract: We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841724

36. High Quality Broadband Brewster's Angle Reflective Polarizer for Infrared Applications
Published: 1/1/1998
Authors: D J Dummer, Simon Grant Kaplan, Leonard M Hanssen, A S Pine, Yuqin Zong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104408

37. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

38. High refractive index immersion fluids for 193 nm immersion lithography
Published: 1/1/2005
Authors: B Budhlall, G Parris, P Zhang, X Gao, Z Zarkov, B Ross, Simon Grant Kaplan, J Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101369

39. High-index materials for 193 nm immersion lithography
Published: 1/1/2005
Authors: J H Burnett, Simon Grant Kaplan, Eric L Shirley, P J Tompkins, J E Webb
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101372

40. Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen
Published: 1/1/2004
Authors: Roger H French, Min K Yang, M F Lemon, R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102696



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