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Author: simon kaplan
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Displaying records 31 to 40 of 73 records.
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31. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

32. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 11/1/2003
Authors: R Gupta, Simon Grant Kaplan
Abstract: We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841724

33. High Quality Broadband Brewster's Angle Reflective Polarizer for Infrared Applications
Published: 1/1/1998
Authors: D J Dummer, Simon Grant Kaplan, Leonard M Hanssen, A S Pine, Yuqin Zong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104408

34. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

35. High refractive index immersion fluids for 193 nm immersion lithography
Published: 1/1/2005
Authors: B Budhlall, G Parris, P Zhang, X Gao, Z Zarkov, B Ross, Simon Grant Kaplan, J Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101369

36. High-index materials for 193 nm immersion lithography
Published: 1/1/2005
Authors: J H Burnett, Simon Grant Kaplan, Eric L Shirley, P J Tompkins, J E Webb
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101372

37. Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques, ed. by A. Yen
Published: 1/1/2004
Authors: Roger H French, Min K Yang, M F Lemon, R A Synowicki, G K Pribil, G Cooney, C M Herzinger, S E Green, John H. Burnett, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102696

38. Infrared Diffuse Reflectance Instrumentation and Standards at NIST
Published: Date unknown
Authors: Leonard M Hanssen, Simon Grant Kaplan
Abstract: A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841308

39. Infrared Refractive Index Measurements using a New Method
Published: 1/1/2001
Authors: D Yang, M E Thomas, W J Tropf, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104266

40. Infrared Transfer Radiometer for Broadband and Spectral Calibration of Space Chambers
Published: 4/23/2010
Authors: Timothy M. Jung, Adriaan C. Carter, Solomon I Woods, Simon Grant Kaplan, Raju Vsnu Datla
Abstract: The Low-Background Infrared (LBIR) facility at NIST has recently completed construction of an infrared transfer radiometer with an integrated cryogenic Fourier transform spectrometer (Cryo-FTS). This mobile system can be deployed to customer sites f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905479



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