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Displaying records 31 to 40 of 79 records.
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31. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials
Published: 6/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
Abstract: To meet the existing demand for measurements of emittance of opaque and semi-transparent materials, a new facility is being built at NIST around a bench-top Fourier spectrometer. This facility will complement existing capabilities for characterizati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841571

32. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials, ed. by B. Fellmuth, J. Seidel, and G. Scholz
Published: 1/1/2003
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104518

33. Fourier transform refractometry
Published: 1/1/1998
Authors: Simon Grant Kaplan, Leonard M Hanssen, U Griesmann, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103915

34. Grain Boundary Induced Magneto-Far Infrared Resonances in Superconducting YBa^d2^Cu^d3^O^d7-δ^ Thin Films
Published: 1/1/1995
Authors: H-T S Lihn, E J Choi, Simon Grant Kaplan, H D Drew, Q Li, D B Fenner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103974

35. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 1/1/2003
Authors: Simon Grant Kaplan, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103911

36. High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer
Series: Journal of Research (NIST JRES)
Published: 11/1/2003
Authors: R Gupta, Simon Grant Kaplan
Abstract: We have constructed a new facility at the National Institute of Standrds and Technology to measure the index of refraction of transmissive materials in the wavelength range from the visible down to the vacuum ultraviolet (VUV). The interferometric t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841724

37. High Quality Broadband Brewster's Angle Reflective Polarizer for Infrared Applications
Published: 3/1/1998
Authors: D J Dummer, Simon Grant Kaplan, Leonard M Hanssen, A S Pine, Yuqin Zong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104408

38. High index optical materials for 193 nm immersion lithography
Published: 1/1/2006
Authors: Simon Grant Kaplan, J H Burnett, Eric L Shirley, D Horowitz, W Clauss, A Grenville, C Van peski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103909

39. High refractive index immersion fluids for 193 nm immersion lithography
Published: 1/1/2005
Authors: B Budhlall, G Parris, P Zhang, X Gao, Z Zarkov, B Ross, Simon Grant Kaplan, J Burnett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101369

40. High-index materials for 193 nm immersion lithography
Published: 1/1/2005
Authors: J H Burnett, Simon Grant Kaplan, Eric L Shirley, P J Tompkins, J E Webb
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101372



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