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Author: simon kaplan

Displaying records 31 to 40 of 77 records.
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31. Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m
Published: 12/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841588

32. Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published: 9/1/2002
Authors: Simon Grant Kaplan, M E Thomas
Abstract: We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm^u-1^ 10000 cm^u-1^ wave number range and temperatures from 10 K to 295 K. The refractive index is determine ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841648

33. Comparison of Near-infrared Transmittance and Reflectance Measurements using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: David W Allen, E A. Early, Leonard M Hanssen, Simon Grant Kaplan, E Nadal m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100958

34. Intercomparison of Transmittance and Reflectance Measurements Using Dispersive and Fourier Transform Spectrophotometers
Published: 1/1/2002
Authors: Simon Grant Kaplan, Leonard M Hanssen, E A. Early, Maria E Nadal, David W Allen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103912

35. Si as a Standard Material for Infrared Reflectance and Transmittance from 2 {mu}m to 5 {mu}m
Published: 1/1/2002
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104520

36. Fourier Transform System for Characterization of Infrared Spectral Emittance of Materials
Published: 6/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan, Sergey Mekhontsev
Abstract: To meet the existing demand for measurements of emittance of opaque and semi-transparent materials, a new facility is being built at NIST around a bench-top Fourier spectrometer. This facility will complement existing capabilities for characterizati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841571

37. Infrared Transmittance Standards-2053, 2054, 2055, and 2056
Published: 5/1/2001
Authors: Leonard M Hanssen, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104522

38. Standard Reference Materials: Infrared Transmittance Standards--SRM's 2053, 2054, 2055, and 2056
Series: Special Publication (NIST SP)
Report Number: 260-123
Published: 5/1/2001
Authors: Simon Grant Kaplan, Leonard M Hanssen
Abstract: Standard Reference Materials 2053, 2054, 2055, and 2056 are transmission filters designed to have nominally neutral attenuation over the 2 mm to 25 mm wavelength region, with optical densities near 1, 2, 3, and 4, respectively. The filters are made o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841489

39. Development of an Adiabatic Laser Calorimeter
Published: 1/1/2001
Authors: Leonard M Hanssen, E Kawate, Simon Grant Kaplan, Raju Vsnu Datla
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103846

40. Infrared Refractive Index Measurements using a New Method
Published: 1/1/2001
Authors: D Yang, M E Thomas, W J Tropf, Simon Grant Kaplan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104266



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