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Displaying records 121 to 130 of 155 records.
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121. Strategic Plan 2010
Published: 4/21/2010
Author: Gerald T Fraser
Abstract: The Optical Technology Division s 2010 Strategic Plan defines the Mission, Vision, and Strategic Elements for the Division. The Strategic Elements consist of Optical Radiation Standards, Optical Measurement Methods, and Optical Measurement Services. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905286

122. Study of the Overtone C-O Stretching Band of Methanol by Multiple Resonance Spectroscopy
Published: 1/1/1995
Authors: L H Xu, A M Andrews, Gerald T Fraser
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104262

123. Submillimeter and THz Detection of Chemical-Warfare Agents in Air
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/31/2004
Authors: Vyacheslav B Podobedov, R J. Lavrich, T M Korter, Gerald T Fraser, David F Plusquellic, A C Samuels
Abstract: Experimental measurements and theoretical calculations were performed to assess the potential for using continuous-wave submillimeter and THz (far-infrared) linear-absorption spectroscopies to detect chemical-warfare agents in air at ambient temperat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841822

124. Submillimeter and THz Detection of Dimethyl Methylphosphonate in Air
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/2004
Authors: Vyacheslav B Podobedov, R J. Lavrich, T M Korter, Gerald T Fraser, David F Plusquellic, A C Samuels
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104717

125. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 1/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101255

126. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 1/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101922

127. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 9/1/2003
Authors: Eric C Benck, G Y Golubiatnikow, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
Abstract: Submillimeter-wavelength, linear-absorption spectroscopy has been applied to the chemical diagnostics of a reactive-ion etching plasma in a modified capacitively coupled Gaseous Electronics Conference (GEC) reactor. Approximately 1 mW of narrow-band ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840653

128. Submillimeter-Wavelength Plasma Diagnostics For Semiconductor Manufacturing, ed. by D.G. Seiler, A.C. Diebold, T.J. Schaffner, R. McDonald, S. Zollner, R.P. Khosla, and E.M. Secula
Published: 3/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, D Lavrich Pluesquelic, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101923

129. System-Level Pre-Launch Calibration of Onboard Solar Diffusers
Published: Date unknown
Authors: R Barnes, Steven W Brown, Keith R Lykke, Gerald T Fraser, James J. Butler
Abstract: Onboard diffuse reflecting plaques are carried to orbit as radiometric reference standards for Earth-observing satellite instruments. For many instruments the reflectance properties of the plaque are characterized independent of the instrument, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841129

130. THz Laser Study of Self-Pressure and Temperature Broadening and Shifts of Water Lines for Pressures up to 1.4 kPa
Published: 1/1/2004
Authors: Vyacheslav B Podobedov, David F Plusquellic, Gerald T Fraser
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104125



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