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Author: gerald fraser
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Displaying records 121 to 130 of 153 records.
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121. Submillimeter and THz Detection of Dimethyl Methyl Phosphonate in Air
Series: NIST Interagency/Internal Report (NISTIR)
Published: Date unknown
Authors: Vyacheslav B Podobedov, R J Lavrich, T M Korter, Gerald T Fraser, David F Plusquellic, A C Samuels
Abstract: Experimental measurements and theoretical calculations were performed to assess the potential for using continuous-wave submillimeter and THz (far-infrared) linear-absorption spectroscopies to detect chemical-warfare agents in air at ambient temperat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841822

122. Submillimeter and THz Detection of Dimethyl Methylphosphonate in Air
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/2004
Authors: Vyacheslav B Podobedov, R J Lavrich, T M Korter, Gerald T Fraser, David F Plusquellic, A C Samuels
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104717

123. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 1/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101255

124. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 1/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101922

125. Submillimeter-Wavelength Plasma Chemical Diagnostics for Semiconductor Manufacturing
Published: 9/1/2003
Authors: Eric C Benck, G Y Golubiatnikow, Gerald T Fraser, B Ji, S A Motika, E J Karwacki
Abstract: Submillimeter-wavelength, linear-absorption spectroscopy has been applied to the chemical diagnostics of a reactive-ion etching plasma in a modified capacitively coupled Gaseous Electronics Conference (GEC) reactor. Approximately 1 mW of narrow-band ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840653

126. Submillimeter-Wavelength Plasma Diagnostics For Semiconductor Manufacturing, ed. by D.G. Seiler, A.C. Diebold, T.J. Schaffner, R. McDonald, S. Zollner, R.P. Khosla, and E.M. Secula
Published: 3/1/2003
Authors: Eric C Benck, G Y Golubiatnikov, Gerald T Fraser, D Lavrich Pluesquelic, B Ji, S A Motika, E J Karwacki
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101923

127. System-Level Pre-Launch Calibration of Onboard Solar Diffusers
Published: Date unknown
Authors: R Barnes, Steven W Brown, Keith R Lykke, Gerald T Fraser, James J. Butler
Abstract: Onboard diffuse reflecting plaques are carried to orbit as radiometric reference standards for Earth-observing satellite instruments. For many instruments the reflectance properties of the plaque are characterized independent of the instrument, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841129

128. THz Laser Study of Self-Pressure and Temperature Broadening and Shifts of Water Lines for Pressures up to 1.4 kPa
Published: 1/1/2004
Authors: Vyacheslav B Podobedov, David F Plusquellic, Gerald T Fraser
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104125

129. THz Laser Study of Self-Pressure and Temperature Broadening and Shifts of Water Lines for Pressures up to 1.4 kPa
Published: 9/1/2004
Authors: Vyacheslav B Podobedov, David F Plusquellic, Gerald T Fraser
Abstract: The self-broadened linewidths of pure rotational lines of water vapor have been investigated in the temperature range 263 K to 340 K and over an extended pressure range from 30 Pa to 1400 Pa using an optically pumped THz photomixer spectrometer havin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841752

130. Temperature and Flux Scales for Heat-Flux Sensor Calibration
Published: 9/1/2003
Authors: A V Murthy, D P DeWitt, Benjamin K Tsai, Gerald T Fraser, Robert D. Saunders
Abstract: Methodologies for calibrating heat-flux sensors designed for direct measurement of heat-transfer at a surface are presented. These sensors, extensively used in fire-test methods and aerospace applications, vary in range from a few kW/m^u2^ to in exc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841678



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