NIST logo

Publications Portal

You searched on: Author: uwe arp Sorted by: date

Displaying records 21 to 30 of 79 records.
Resort by: Date / Title


21. 40 Years of Metrology With Synchrotron Radiation at SURF
Published: 9/1/2003
Authors: Uwe Arp, Steven E Grantham, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840164

22. Scientific Applications and Advantages of a Low Energy Synchrotron Radiation Source
Published: 8/1/2003
Author: Uwe Arp
Abstract: Recent improvements to the synchrotron ultraviolet radiation facility led to unprecedented performance. High injection currents and beam stability, as well as tunable electron energies over a wide range make this storage ring a prime source for synch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840141

23. Response of Chromium-Doped Alumina Screens to Soft X-Rays Using Synchrotron Radiation
Published: 7/1/2003
Authors: James K McCarthy, Uwe Arp, A Baciero, B Zurro, B A Karlin
Abstract: We have measured the response of chromium-doped alumina screens to soft x-ray radiation and derived quantum efficiency curves for the energy range from 2.5 keV to 4.5 keV. Persistent luminescence (or afterglow) from this material is observed for sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840144

24. SURF III Web Site
Published: 6/1/2003
Author: Uwe Arp
Abstract: Web site is:http://sed.nist.gov/Arp/SURFWWW/index.html
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840134

25. A SURF Beamline for Synchrotron Source-Based Absolute Radiometry
Published: 2/1/2003
Authors: Ping-Shine Shaw, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: A new source-based radiometry beamline at Synchrotron Ultraviolet Radiation Facility (SURF III) was constructed recently. The goal of this beamline is to establish a national source standard with wide spectral range from far UVto IR by using the cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841629

26. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward W Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

27. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward W Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

28. Response of chromium-doped alumina screens to soft x rays using synchrotron radiation
Published: 1/1/2003
Authors: James K McCarthy, Uwe Arp, A Baciero, B Zurro, B A Karlin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101616

29. SURF III: The scientific case for a low energy synchrotron radiation source, edited by J. L. Duggan and I. L. Morgan
Published: 1/1/2003
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101814

30. Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation
Published: 12/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
Abstract: We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840027



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series