NIST logo

Publications Portal

You searched on:
Author: uwe arp
Sorted by: date

Displaying records 21 to 30 of 77 records.
Resort by: Date / Title


21. Response of Chromium-Doped Alumina Screens to Soft X-Rays Using Synchrotron Radiation
Published: 7/1/2003
Authors: James K McCarthy, Uwe Arp, A Baciero, B Zurro, B A Karlin
Abstract: We have measured the response of chromium-doped alumina screens to soft x-ray radiation and derived quantum efficiency curves for the energy range from 2.5 keV to 4.5 keV. Persistent luminescence (or afterglow) from this material is observed for sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840144

22. SURF III Web Site
Published: 6/1/2003
Author: Uwe Arp
Abstract: Web site is:http://sed.nist.gov/Arp/SURFWWW/index.html
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840134

23. A SURF Beamline for Synchrotron Source-Based Absolute Radiometry
Published: 2/1/2003
Authors: Ping-Shine Shaw, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: A new source-based radiometry beamline at Synchrotron Ultraviolet Radiation Facility (SURF III) was constructed recently. The goal of this beamline is to establish a national source standard with wide spectral range from far UVto IR by using the cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841629

24. Forty Years of Metrology with Synchrtron Radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100995

25. Forty years of metrology with synchrotron radiation at SURF
Published: 1/1/2003
Authors: Uwe Arp, Alex P. Farrell, Mitchell L. Furst, Steven E Grantham, Edward Walter Hagley, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100997

26. Response of chromium-doped alumina screens to soft x rays using synchrotron radiation
Published: 1/1/2003
Authors: James K McCarthy, Uwe Arp, A Baciero, B Zurro, B A Karlin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101616

27. SURF III: The scientific case for a low energy synchrotron radiation source, edited by J. L. Duggan and I. L. Morgan
Published: 1/1/2003
Author: Uwe Arp
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101814

28. Characterisation of the Response of Chromium-Doped Alumina Screens in the Vacuum Ultraviolet Using Synchrotron Radiation
Published: 12/1/2002
Authors: James K McCarthy, A Baciero, B Zurro, Uwe Arp, Charles S Tarrio, Thomas B Lucatorto, A Morono, P Martin, E R Hodgson
Abstract: We have measured the response of chromium-doped alumina screens to vacuum ultraviolet radiation and derived quantum efficiency curves for the energy range from 30 to 300 eV. A model is presented to explain the structure in this curve. In addition, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840027

29. Influence of the Vertical Emittance on the Calculability of the Synchrotron Ultraviolet Radiation Facility
Series: Journal of Research (NIST JRES)
Published: 10/1/2002
Author: Uwe Arp
Abstract: A method to include the influence of the vertical electron beam emittance onto the calculability of synchrotron radiation is introduced. It accounts for the finite vertical size and angular spread of the electron beam through a convolution procedure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840148

30. Studies of Intensity Noise at Synchrotron Ultraviolet Radiation Facility III
Published: 3/1/2002
Authors: Uwe Arp, Thomas B Lucatorto, K Harkay, K Kim
Abstract: Suppression of beam instabilities has become an important goal at synchrotron radiation light sources, where highly sensitive applications like metrology, Fourier--transform spectroscopy and microscopy are now in use. We describe measurements connect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841549



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series