NIST logo

Publications Portal

You searched on:
Author: uwe arp
Sorted by: date

Displaying records 11 to 20 of 74 records.
Resort by: Date / Title


11. Absolute radiant flux measurement for the angular distribution of synchrotron radiation
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104163

12. Absolute radiant flux measurement of the angular distribution of synchrotron radiation,
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101711

13. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972

14. Damage to Solid-State Photodiodes by Vacuum Ultraviolet Radiation
Published: 6/1/2005
Authors: Uwe Arp, Ping-Shine Shaw, R Gupta, Keith R Lykke
Abstract: We report experimental results on the stability of photodiodes obtained at three different wavelengths in the vacuum ultraviolet spectral region. Two of these experiments were based on radiation damage inflicted with excimer lasers at 193 nm and 157 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840194

15. Damage to solid-state photodiodes by vacuum ultraviolet radiation
Published: 1/1/2005
Authors: Uwe Arp, R Gupta, L R Lykke, Ping-Shine Shaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100986

16. 40 Years of Metrology With Synchrotron Radiation at SURF
Published: 9/1/2003
Authors: Uwe Arp, Steven E Grantham, Simon Grant Kaplan, Ping-Shine Shaw, Charles S Tarrio, Robert Edward Vest
Abstract: the advantages of a compact synchrotron radiation source like the Synchrotron Ultraviolet Radiation Facility for metrology in the ultraviolet and extreme ultraviolet are shown. The capabilities of the different experimental stations are explained an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840164

17. Scientific Applications and Advantages of a Low Energy Synchrotron Radiation Source
Published: 8/1/2003
Author: Uwe Arp
Abstract: Recent improvements to the synchrotron ultraviolet radiation facility led to unprecedented performance. High injection currents and beam stability, as well as tunable electron energies over a wide range make this storage ring a prime source for synch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840141

18. Response of Chromium-Doped Alumina Screens to Soft X-Rays Using Synchrotron Radiation
Published: 7/1/2003
Authors: James K McCarthy, Uwe Arp, A Baciero, B Zurro, B A Karlin
Abstract: We have measured the response of chromium-doped alumina screens to soft x-ray radiation and derived quantum efficiency curves for the energy range from 2.5 keV to 4.5 keV. Persistent luminescence (or afterglow) from this material is observed for sev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840144

19. SURF III Web Site
Published: 6/1/2003
Author: Uwe Arp
Abstract: Web site is:http://sed.nist.gov/Arp/SURFWWW/index.html
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840134

20. A SURF Beamline for Synchrotron Source-Based Absolute Radiometry
Published: 2/1/2003
Authors: Ping-Shine Shaw, Uwe Arp, Howard W Yoon, Robert D. Saunders, Albert C Parr, Keith R Lykke
Abstract: A new source-based radiometry beamline at Synchrotron Ultraviolet Radiation Facility (SURF III) was constructed recently. The goal of this beamline is to establish a national source standard with wide spectral range from far UVto IR by using the cal ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841629



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series