NIST logo

Publications Portal

You searched on: Author: uwe arp Sorted by: date

Displaying records 11 to 20 of 81 records.
Resort by: Date / Title


11. Bilateral NIST-PTB Comparison of Spectral Responsivity in the VUV
Published: 1/20/2011
Authors: Uwe Arp, Ping-Shine Shaw, Zhigang Li, Alexander Gottwald, Mathias Richter
Abstract: To compare the calibration capabilities for the spectral responsivity in the vacuum-ultraviolet spectral region between 135 nm and 250 nm, PTB and NIST agreed on a bilateral comparison. Calibrations of semiconductor photodiodes as transfer detectors ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905153

12. Long-Term Monitoring of the Ultraviolet Irradiance Scale at the Facility for Irradiance Calibration Using Synchrotrons
Published: 6/18/2010
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Charles E Gibson, Howard W Yoon, Keith R. Lykke
Abstract: In 2004, the National Institute of Standards and Technology (NIST) established the ultraviolet (UV) spectral irradiance scale from 200 nm to 400 nm using the calculable irradiance of the Synchrotron Ultraviolet Radiation Facility (SURF). Since the es ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904737

13. Measurement of the ultraviolet-induced fluorescence yield from integrating spheres
Published: 6/2/2009
Authors: Ping-Shine Shaw, Uwe Arp, Keith R. Lykke
Abstract: We report theory and measurements of a simple and absolute technique for the determination of the total emitted spectral fluorescence yield inside an integrating sphere from the sphere coating under irradiation with a monochromatic beam. This techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842602

14. Uniform and enhanced field emission from chromium oxide coated carbon nanosheets
Published: 4/2/2008
Authors: Uwe Arp, Kun Hou, Ronald Outlaw, Wang Sigen, Mingyao Zhu, Ronald Quinlan, Dennis Manos, Martin Kordesch, Brian Holloway
Abstract: Carbon nanosheets, a two-dimensional carbon nanostructure, are promising electron cathode materials for applications in vacuum microelectronic devices. This letter demonstrates a simple approach to improve the spatial emission uniformity of carbon na ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903061

15. Ultraviolet Characterization of Integrating Spheres
Published: 7/9/2007
Authors: Ping-Shine Shaw, Zhigang Li, Uwe Arp, Keith R. Lykke
Abstract: We have studied the performance of integrating spheres in the ultraviolet (UV) with wavelengths as short as 200 nm. Two techniques were used for this study; first, the spectral throughput of an integrating sphere irradiated by a deuterium lamp was an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841052

16. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R. Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

17. Absolute Radiant Flux Measurement of the Angular Distribution of Synchrotron Radiation
Published: 7/11/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R. Lykke
Abstract: We have measured the absolute radiant flux of synchrotron radiation as a function of the angle above and below the orbital plane with high accuracy at the Synchrotron Ultraviolet Radiation Facility (SURF III) and the results were compared with theore ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840997

18. Absolute radiant flux measurement for the angular distribution of synchrotron radiation
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R. Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104163

19. Absolute radiant flux measurement of the angular distribution of synchrotron radiation,
Published: 1/1/2006
Authors: Ping-Shine Shaw, Uwe Arp, Keith R. Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101711

20. UV and VUV radiometry programs at the Synchrotron Ultraviolet Radiation Facility (SURF III)
Published: 1/1/2006
Authors: Zhigang Li, Ping-Shine Shaw, Uwe Arp, Keith R. Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103972



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series