Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: brian zimmerman Sorted by: date

Displaying records 1 to 10 of 56 records.
Resort by: Date / Title


1. (Mis)use of 133Ba as a calibration surrogate for 131I in clinical activity calibrators
Published: 3/1/2016
Authors: Brian Edward Zimmerman, Denis E Bergeron
Abstract: Using NIST-calibrated solutions of 131Ba and 131I in the 5 mL NIST ampoule geometry, measurements were made in three NIST-maintained Capintec activity calibrators and the NIST Vinten 671 ionization chamber to evaluate the suitability of using 133Ba a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918657

2. Comparison of C-14 liquid scintillation counting at NIST and NRC Canada
Published: 3/1/2016
Authors: Denis E Bergeron, Raphael Galea, Lizbeth Laureano-Perez, Brian Edward Zimmerman
Abstract: An informal bilateral comparison of 14C liquid scintillation (LS) counting at the National Research Council of Canada (NRC) and the National Institute of Standards and Technology (NIST) has been completed. Two solutions, one containing 14C-labeled so ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918474

3. Long-term stability of carrier-added Ge-68 standardized solutions
Published: 3/1/2016
Authors: Brian Edward Zimmerman, Denis E Bergeron, Ryan P Fitzgerald, Jeffrey T Cessna
Abstract: Tests for chemical stability were carried out on carrier-added 68Ge solutions prepared and calibrated in 2007 and 2011 to evaluate the suitability of the specific composition as a potential Standard Reference Material. Massic count rates of the store ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918733

4. Impact of recent change in NIST standard for 18F on the relative response of 68Ge-based mock syringe dose calibrator standards
Published: 7/16/2015
Authors: Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna
Abstract: As a result of a recent change in the National Institute of Standards and Technology (NIST) activity standard for 18F, we have determined new relative response ratios for a 68Ge solid epoxy mock syringe source used in activity calibrators as a long-l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918048

5. Determination of photon emission probabilities for the main gamma-rays of 223Ra in equilibrium with its progeny
Published: 3/11/2015
Authors: Leticia S Pibida, Brian Edward Zimmerman, Ryan P Fitzgerald, Lynne Emily King, Jeffrey T Cessna, Denis E Bergeron
Abstract: The currently published 223Ra gamma-ray emission probabilities display a wide variation in the values depending on the source of the data. The National Institute of Standards and Technology performed activity measurements on a 223Ra solution that was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916239

6. Secondary standards for 223Ra revised
Published: 3/5/2015
Authors: Denis E Bergeron, Jeffrey T Cessna, Brian Edward Zimmerman
Abstract: Dose calibrator dial settings reported by NIST in 2010 (ARI v. 68, p. 1367) are now known to give erroneously low (by 10 %) activity readings. The original determinations were based on a chain of calibrations; a broken link in this chain was recentl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917094

7. A review of NIST primary activity standards for 18F: 1982 to 2013
Series: Journal of Research (NIST JRES)
Published: 8/27/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Bert M Coursey, Ryan P Fitzgerald, Brian Edward Zimmerman
Abstract: The new NIST activity standardization for 18F differs from results obtained between 1998 and 2008 by 4 %. The new results are considered to be very reliable; they are based on a battery of robust primary measurement techniques and bring the NIST sta ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915421

8. Dose calibrator manufacturer-dependent bias in assays of 123I
Published: 3/26/2014
Authors: Denis E Bergeron, Jeffrey T Cessna, Daniel Benjamin Golas, Rheannan K Young, Brian Edward Zimmerman
Abstract: Calibration factors for commercial ionization chambers (i.e. dose calibrators) were determined for a solution of 123I; the activity was based on the 1976 NBS standard. A link between the NIST standard and the International Reference System (SIR) was ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915010

9. A New NIST Primary Standardization of 18F
Published: 2/1/2014
Authors: Ryan P Fitzgerald, Brian Edward Zimmerman, Denis E Bergeron, Jeffrey T Cessna, Leticia S Pibida, Denise S Moreira
Abstract: A new primary standardization of 18F by NIST is reported. The standard is based on live-timed beta- gamma anticoincidence counting with confirmatory measurements by three other methods: (i) liquid scintillation (LS) counting using CIEMAT/NIST 3H e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914677

10. Calibration of traceable solid mock I-131 phantoms used in an international SPECT image quantification comparison
Series: Journal of Research (NIST JRES)
Report Number: 118.017
Published: 8/15/2013
Authors: Brian Edward Zimmerman, Leticia S Pibida, Lynne Emily King, Denis E Bergeron, Jeffrey T Cessna, Matthew Merril Mille
Abstract: The International Atomic Energy Agency (IAEA) has organized an international comparison to assess Single Photon Emission Computed Tomography (SPECT) image quantification capabilities in 12 countries. Iodine-131 was chosen as the radionuclide for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913572



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series