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You searched on: Author: nien zhang

Displaying records 51 to 60 of 71 records.
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51. An Approach to Combining Results from Multiple Methods Motivated by the ISO GUM
Series: Journal of Research (NIST JRES)
Published: 8/1/2000
Authors: M Levenson, D L. Banks, K Eberhardt, L M. Gill, William F Guthrie, Hung-Kung Liu, M Vangel, James H Yen, Nien F Zhang
Abstract: The problem of determining a consensus value and its uncertainty from the results of multiple methods or laboratories is discussed. Desirable criteria of a solution are presented. A solution based on the ISO Guide to the Expression of Uncertainty i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151758

52. Potentials of On-Line Scanning Electron Microscope Performance Analysis Using NIST Reference Material 8091
Published: 6/1/2000
Authors: Michael T Postek, Andras Vladar, Nien F Zhang, Robert D. Larrabee
Abstract: Fully automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an important aspect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820975

53. Thermal Modeling of Calorimeters for Excimer Lasers at 193 nm Wavelength
Published: 6/1/2000
Authors: D X Chen, Marla L Dowell, Christopher L. (Christopher L.) Cromer, Nien F Zhang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23431

54. Potentials of Online Scanning Electron Microscope Performance Analysis Using NIST Reference Material 8091
Published: 3/1/2000
Authors: Michael T Postek, Andras Vladar, Nien F Zhang, Robert D. Larrabee
Abstract: Fully automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an important aspect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823128

55. Far-Infrared Transmittance and Reflectance of YBa^d2^Cu^d3^O^d7-x^ Films on Si Substrates
Published: 12/31/1999
Authors: A. R. Kumar, Nien F Zhang, V. A. Boychev, D. B. Tanner, Leila R Vale, David A Rudman
Abstract: The transmittance and reflectance of superconductive YBa^d2^Cu^d3^O^d7-{gamma} (YBCO) thin films deposited on Si substrates have been measured in the far-infrared frequency region from 10 to 100 cm^u-1^ (wavelength from 1000 to 100 micro {mu}) at tem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6104

56. Image Sharpness Measurement in Scanning Electron Microscope - Part III
Published: 7/1/1999
Authors: Samuel N Jones, Robert D. Larrabee, Michael T Postek, Andras Vladar, Nien F Zhang
Abstract: Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. Testing and proving that the instrument is performing at a satisfactory level of sharpness is an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821795

57. Comparisons of Control Charts for Autocorrelated Data
Published: 1/1/1999
Author: Nien F Zhang
Abstract: Recently, statistical process control (SPC) methodolgies have been developed to accommodate autocorrelated data. A primary method to deal with autocorrelated data is the use of residual charts. Although this methodology has the advantage that it ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151733

58. Heat Transfer Analysis and Modeling of a Cryogenic Laser Radiometer
Published: 12/1/1998
Authors: T J. Johnson, A. R. Kumar, Nien F Zhang, David J Livigni, Christopher L. (Christopher L.) Cromer, Thomas Scott
Abstract: This study investigates the laser optimized cryogenic radiometer (LOCR) recently acquired by the National Institute of Standards and Technology in Boulder, Colorado, to calibrate laser power meters and detectors.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6237

59. Blind Men and Elephants: Six Approaches to TREC Data
Published: 10/28/1998
Authors: D L. Banks, Paul Douglas Over, Nien F Zhang
Abstract: The paper reviews six recent efforts to better understand performance measurements on information retrieval (IR) within the framework of the Text REtrieval Conferences (TREC): analysis of variance, cluster analyses, rank correlations, beadplots, mil ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151743

60. Thermal Characterization of a Cryogenic Radiometer and Comparison with a Laser Calorimeter
Published: 10/1/1998
Authors: David J Livigni, Christopher L. (Christopher L.) Cromer, Thomas Scott, T J. Johnson, Nien F Zhang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21928



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