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Displaying records 21 to 30 of 71 records.
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21. SIM.EM-K1, 1 Ohm,SIM.EM-K2, 1 GOhm, and SIM.EM-S6, 1 MOhm: RMO COMPARISON REPORT, FINAL REPORT
Published: 1/1/2009
Authors: Randolph E Elmquist, Dean G Jarrett, Nien F Zhang
Abstract: 2006 - 2007 Resistance standards comparison between SIM Laboratories Pilot Laboratory: National Institute of Standards and Technology, Gaithersburg, MD, USA. Revised March 2008.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33025

22. Allan Variance of Time Series Models of Measurement Data
Published: 9/22/2008
Author: Nien F Zhang
Abstract: The uncertainty of the mean of autocorrelated measurements from a stationary process has been discussed in the literature. However, when the measurements are from a non-stationary process, how to assess their uncertainty remains unresolved. Allan v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152041

23. Does the Angle of a Fingerprint Scanner Affect User Performance?
Published: 9/22/2008
Authors: Mary Frances Theofanos, Ross J Micheals, Shahram Orandi, Brian C Stanton, Nien F Zhang, Charles L Sheppard
Abstract: As the deployment of biometric technologies such as fingerprints has become more widespread in government applications there is an increased awareness of the human-computer interaction that such technologies involve. User behavior can impact operatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51336

24. SIM COMPARISON OF DC RESISTANCE AT 1 Ohm, 1 MOhm, AND 1 GOhm
Report Number: 32890
Published: 6/1/2008
Authors: Dean G Jarrett, Randolph E Elmquist, Nien F Zhang, Alejandra Tonina, Janice Fernandes, Daniel Izquierdo, Dave Inglis, Felipe Hernandez-Marquez
Abstract: A regional comparison of DC resistance standards at the nominal values of 1 Ohm, 1 MOhm, and 1 GOhm has recently been completed in the System Interamericano de Metrogia (SIM) region. The motivation, design, standards, and results of this regional com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32890

25. How the User can Improve Fingerprint Image Quality
Published: 5/12/2008
Authors: Mary Frances Theofanos, Ross J Micheals, Shahram Orandi, Brian C Stanton, Nien F Zhang
Abstract: Traditionally the biometric field has viewed the user as a passive source of the biometric sample rather than an interactive component of the biometric system. But fingerprint image quality is highly dependent on the human computer interaction and us ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51194

26. Usability Testing of Height and Angles of Ten-Print Fingerprint Capture
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7504
Published: 5/11/2008
Authors: Mary Frances Theofanos, Brian C Stanton, Charles L Sheppard, Ross J Micheals, John W. Wydler II, Nien F Zhang, Lawrence Nadel, William Rubin
Abstract: As the deployment of biometric technologies such as fingerprints has become more widespread in government applications there is an increased awareness of the human-computer interaction that such technologies involve. User behavior can impact operatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152149

27. Usability Testing of Ten-Print Fingerprint Capture
Published: 10/8/2007
Authors: Brian C Stanton, Mary Frances Theofanos, Shahram Orandi, Ross J Micheals, Nien F Zhang
Abstract: Despite the increased deployment of biometric technologies in United States government applications, not enough attention is being paid to the human factors that such technologies involve. The use of biometric applications will be unfamiliar to many ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51098

28. Effects of Scanner Height on Fingerprint Capture
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7382
Published: 6/27/2007
Authors: Mary Frances Theofanos, Shahram Orandi, Ross J Micheals, Brian C Stanton, Nien F Zhang
Abstract: Although there is widespread deployment of biometric technologies such as fingerprint systems, little attention is being paid to the human-computer interaction that such technologies involved. This report presents the results of a study that examined ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50903

29. Usability Testing of Ten-Print Fingerprint Capture
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7403
Published: 3/13/2007
Authors: Mary Frances Theofanos, Brian C Stanton, Shahram Orandi, Ross J Micheals, Nien F Zhang
Abstract: The Department of Homeland Security (DHS) and the United States Visitor and Immigrant Status Indicator Technology (US-VISIT) program are migrating from a two print capture process (left and right index fingers) to a ten-print slap fingerprint capture ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=51123

30. An Application of Combining Results from Multiple Methods - Statistical Evaluation of Uncertainty for NIST SRM 1508a
Published: 11/1/2006
Authors: Susan Shu Cheng Tai, Adriana Hornikova, Nien F Zhang, Michael James Welch
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904355



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