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Author: dylan williams

Displaying records 131 to 140 of 155 records.
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131. Accurate Transmission Line Characterization
Published: 8/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9032

132. Reciprocity Relations in Waveguide Junctions
Published: 7/1/1993
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4756

133. Calibrating On-Wafer Probes to the Probe Tips
Published: 12/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19010

134. Interconnection Transmission Line Parameter Characterization
Published: 12/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3071

135. Planar Resistors for Probe Station Calibration
Published: 12/1/1992
Authors: David K Walker, Dylan F Williams, Nicole Morgan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16177

136. A General Waveguide Circuit Theory
Series: Journal of Research (NIST JRES)
Published: 10/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6581

137. Wafer Probe Transducer Efficiency
Published: 10/1/1992
Authors: Dylan F Williams, Roger Marks, David K Walker, Fred R. Clague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15664

138. Accurate Experimental Characterization of Interconnects: A Discussion of 'Experimental Electrical Characterization of Interconnects and Discontinuities in High-Speed Digital Systems'
Published: 8/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=656

139. Comments on 'Characterization of Resistive Transmission Lines by Short-Pulse Propagation'
Published: 8/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3034

140. Complex Permittivity Measurements of Gallium Arsenide Using a High-Precision Resonant Cavity
Published: 6/1/1992
Authors: E. J. Vanzura, Claude Weil, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9451



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