NIST logo

Publications Portal

You searched on:
Author: dylan williams

Displaying records 131 to 140 of 149 records.
Resort by: Date / Title


131. Wafer Probe Transducer Efficiency
Published: 10/1/1992
Authors: Dylan F Williams, Roger Marks, David K Walker, Fred R. Clague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15664

132. Accurate Experimental Characterization of Interconnects: A Discussion of 'Experimental Electrical Characterization of Interconnects and Discontinuities in High-Speed Digital Systems'
Published: 8/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=656

133. Comments on 'Characterization of Resistive Transmission Lines by Short-Pulse Propagation'
Published: 8/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3034

134. Complex Permittivity Measurements of Gallium Arsenide Using a High-Precision Resonant Cavity
Published: 6/1/1992
Authors: E. J. Vanzura, Claude Weil, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9451

135. Traceability for On-Wafer MMIC Measurements
Published: 6/1/1992
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19412

136. Verification of Scattering Parameter Measurements
Published: 6/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27632

137. Frequency-Dependent Transmission Line Parameters
Published: 4/1/1992
Authors: Dylan F Williams, Roger Marks
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23193

138. Benchmark for the Verification of Microwave CAD Software
Published: 12/1/1991
Authors: R. Furlow, R. Y. Shimoda, Dylan F Williams, Roger Marks, Kuldip Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12768

139. Comparison of On-Wafer Calibrations
Published: 12/1/1991
Authors: Dylan F Williams, Roger Marks, A. Davidson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25109

140. Reciprocity Relations for On-Wafer Power Measurements
Published: 12/1/1991
Authors: Roger Marks, Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24571



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series