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You searched on: Author: dylan williams

Displaying records 131 to 140 of 180 records.
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131. Lumped-Element Impedance Standards
Published: 6/1/1998
Authors: Dylan F Williams, David K Walker
Abstract: We measure the electrical parameters of commercial lumped-element impedance standards manufactured for the calibration of on-wafer probing systems. The standard's impedance depends not only on the standard itself, but also on probe placement, probe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=21060

132. Metal-Insulator-Semiconductor Transmission Line Model
Published: 6/1/1998
Author: Dylan F Williams
Abstract: This paper investigates the one-dimensional metal-insulator-semiconductor transmission line. It develops closed-form expressions for equivalent-circuit parameters, compares them to exact calculations, and explores their limitations. It also investiga ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18999

133. Series-Resistor Calibration
Published: 12/1/1997
Authors: Dylan F Williams, David K Walker
Abstract: We develop a coplanar-waveguide probe-tip scattering parameter calibration based on a thru, a reflect, and an accurately modeled Series resistor. Comparison to a multiline Thru-Reflect-Line calibration verifies the accuracy of the method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18424

134. Quasi-TEM Model for Coplanar Waveguide on Silicon
Published: 10/1/1997
Authors: Dylan F Williams, Michael D Janezic, A. Ralston
Abstract: This paper compares a simple quasi-TEM model for coplanar waveguide fabricated on moderately doped silicon substrates to measurement. While the coplanar waveguide currents and magnetic fields are unaffected by the substrate, a simple capacitive mode ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16758

135. A Complete Multinode Equivalent-circuit Theory for Electrical Design
Series: Journal of Research (NIST JRES)
Published: 8/1/1997
Authors: Dylan F Williams, Roger Marks, L. A. Hayden
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5289

136. Characterization of Embedded Multiconductor Transmission Lines
Published: 6/1/1997
Author: Dylan F Williams
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14641

137. Permittivity Characterization from Transmission-Line Measurement
Published: 6/1/1997
Authors: Michael D Janezic, Dylan F Williams
Abstract: We analyze three accurate broadband techniques for measuring the complex permittivity of dielectric substrates using coplanar waveguide transmission-line measurements and demonstrate good agreement with single-frequency cavity measurements.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18591

138. Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration
Published: 4/1/1997
Authors: David K Walker, Dylan F Williams
Abstract: We show how coplanar-waveguide probe-tip scattering parameter calibrations performed in one coplanar waveguide conductor geometry may be adjusted for measurement in another. The method models the difference between the two probe-tip-to-coplanar-waveg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25657

139. Calibration in Multiconductor Transmission Lines
Published: 12/1/1996
Author: Dylan F Williams
Abstract: Abstract: This paper presents a calibration and measurement method for circuits embedded in lossy printed multiconductor transmission lines. The experimental results illustrate the complexity of the modal representation and the utility of the conduct ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13978

140. Modal Cross Power in Quasi-TEM Transmission Lines
Published: 11/1/1996
Authors: Dylan F Williams, F. Olyslager
Abstract: This paper examines modal cross power in electromagnetic transmission lines. It shows that the cross powers of nearly degenerate modes may be large in quasi-TEM multiconductor transmission lines typical of modern electronic circuits at moderate and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1603



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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series