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You searched on: Author: scott wight

Displaying records 11 to 20 of 37 records.
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11. High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
Published: 3/21/2005
Authors: Dale E Newbury, J H J Scott, Scott A Wight, J T. Armstrong, John A Small
Abstract: Transmission (TEM) and scanning electron microscopes (SEM) provide ideal platforms for electron and x-ray spectrometry to characterize nanoscale particles and nanostructured bulk materials. Electron spectrometry includes electron energy loss spectro ...

12. Characterization of Colloidal Material Fom Natural and Engineered Waters Investigating Structure-Function Relationships Through Microanalysis
Published: 2/1/2004
Authors: Richard D Holbrook, Scott A Wight, Dale E Newbury
Abstract: The fate, transport and ultimate impact of toxic compounds in aquatic systems is governed by their distribution between the particulate, colloidal and dissolved phases. Colloids, conventionally defined as solid material between 1 nm and 1 m in size, ...

13. Bevel Depth Profiling SIMS for Analysis of Layer Structures
Published: 9/1/2003
Authors: John G Gillen, Scott A Wight, P Chi, Albert J. Fahey, Jennifer R Verkouteren, Eric S Windsor, D. B. Fenner
Abstract: We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or ce ...

14. Optimizing Thermal-Optical Methods for Measuring Atmospheric Elemental (Black) Carbon: A Response Surface Study
Published: 9/1/2003
Authors: Joseph M Conny, D Klinedinst, Scott A Wight, J L Paulsen
Abstract: The chemical, physical, and morphological complexity of atmospheric aerosol black carbon (BC) presents major problems in measurement accuracy. Methods based on thermal-optical analysis (TOA) are widely used for ambient air samples because no prior kn ...

15. Copper Oxide Precipitates in NBS Standard Reference Material 482
Series: Journal of Research (NIST JRES)
Published: 12/1/2002
Authors: Eric S Windsor, R Carlton, John G Gillen, Scott A Wight, David Seymour Bright
Abstract: Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on ...

16. Preliminary Report on the Biocompatibility of a Moldable, Resorbable, Composite Bone Graft Consisting of Calcium Phosphate Cement and Poly (Lactide-Co-Glycolide) Microspheres
Published: 5/1/2002
Authors: Carl George Simon Jr., C A Khatri, Scott A Wight, Francis W Wang
Abstract: We have assessed the biocompatibility of a new composite bone graft consisting of calcium phosphate cement (CPC) and poly(lactide-co-glycolide) (PLGA) microspheres (175-350 ?m) using cell culture techniques. CPC powder is mixed with PLGA microsphere ...

17. Experimental Data and Model Simulations of Beam Spread in the Environmental Scanning Electron Microscope
Published: 10/1/2001
Author: Scott A Wight
Abstract: This work describes the comparison of experimental measurements of electron beam spread in the environmental scanning electron microscope with model predictions. Beam spreading is the result of primary electrons being scattered out of the focused be ...

18. SRM 482 Revisited After 30 Years
Published: 8/1/2001
Authors: Eric S Windsor, R Carlton, Scott A Wight, C Lyman
Abstract: The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard ...

19. Phosphor Imaging Plate Measurement of Electron Scattering in the Environmental Scanning Electron Microscope
Published: 8/1/2000
Authors: Scott A Wight, Cynthia J Zeissler
Abstract: Phosphor Imaging Plate Technology is applied to electron beam scattering in the Environmental Scanning Electron Microscope. The plate is exposed to primary and scattered electrons which stimulate the phosphor grains to an excited state. The intensi ...

20. Characterization of the Electron Beam Specimen Interaction in the ESEM with SIM Imaging
Published: 7/1/2000
Authors: Scott A Wight, John G Gillen, G B. Saupe
Abstract: A Secondary Ion Mass Spectrometry (SIMS) study has been undertaken to examine surfaces and films modified in the environmental scanning electron microscope (ESEM). Examination of the modifications induced by ESEM electrons and ions lead to a better ...

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