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1. The Second National Ballistics Imaging Comparison (NBIC-2)
Series: Journal of Research (NIST JRES)
Published: 1/5/2015
Authors: Theodore Vincent Vorburger, James H Yen, Jun-Feng Song, Robert Meryln Thompson, Thomas B Renegar, Xiaoyu A Zheng, Mingsi Tong, Martin G Ols
Abstract: In response to the guidelines issued by the American Society of Crime Laboratory Directors/Laboratory Accreditation Board (ASCLD/LAB-International) to establish traceability and quality assurance in U.S. crime laboratories, NIST and the ATF initiated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916335

2. NIST SURFACE ROUGHNESS AND STEP HEIGHT CALIBRATIONS, Measurement Conditions and Sources of Uncertainty
Published: 3/18/2014
Authors: Theodore Vincent Vorburger, Thomas B Renegar, Xiaoyu A Zheng, Jun-Feng Song, Johannes A Soons, Richard M Silver
Abstract: NIST methods for calibration of surface roughness parameters and step height are described. The surface roughness parameters currently being measured include roughness average (Ra), root mean square (rms) roughness (Rq), average maximum height of the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915207

3. Applications of Surface Metrology in Firearm Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. Toolmarks are created when a tool comes into contact with a surface an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914401

4. Applications of Surface Metrology in Toolmark Identification
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

5. Automatic Identification of Bullet Signatures Based on Consecutive Matching Striae (CMS) Criteria
Published: 9/10/2013
Authors: Wei Chu, Robert Meryln Thompson, Jun-Feng Song, Theodore Vincent Vorburger
Abstract: The consecutive matching striae (CMS) numeric criteria for firearm and toolmark identifications have been widely accepted by forensic examiners, although there have been questions concerning its observer subjectivity and limited statistical support. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911028

6. The Effect of Tip Size in Calibration of Surface Roughness Specimens with Rectangular Profiles
Published: 9/2/2013
Authors: Jun-Feng Song, Thomas B Renegar, Johannes A Soons, Balasubramanian Muralikrishnan, John S Villarrubia, Xiaoyu A Zheng, Theodore Vincent Vorburger
Abstract: For the calibration of rectangular and trapezoidal profile roughness specimens, stylus tip will increase profile peak width and decrease valley width, which may cause the Ra changes (either increase or decrease, depends on the profile shape). Someti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911850

7. Distributed Force Probe Bending Model of CD-AFM Bias
Published: 4/1/2013
Authors: Vladimir A. Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology technique. To characterize modern semiconductor devices, small and flexible probes, often 15 nm to 20 nm in diameter, are used. Recent studies have reported uncontrolled and signif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912266

8. User's Guide for RM 8096 and 8097: The MEMS 5-in-1, 2013 Edition
Series: Special Publication (NIST SP)
Report Number: 260-177
Published: 2/15/2013
Authors: Janet M Cassard, Jon C Geist, Theodore Vincent Vorburger, David Thomas Read, Michael Gaitan, David G Seiler
Abstract: The Microelectromechanical Systems (MEMS) 5-in-1 is a reference device sold as a NIST Reference Material (RM) that contains MEMS test structures on a test chip. The two RM chips (8096 and 8097) provide for both dimensional and material property ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910746

9. Topography Measurements and Performance Comparisons between NIST SRM 2460 Standard Bullet Masters and BKA Bullet Replicas
Published: 7/31/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Robert Meryln Thompson, Susan M Ballou, Xiaoyu A Zheng, Thomas B Renegar, Richard M Silver
Abstract: Two Standard Reference Material (SRM) 2460 Bullets produced by the National Institute of Standards and Technology (NIST) were used as masters for the fabrication of replica bullets at the Bundeskriminalamt (BKA). The surface topography of the SRM ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908222

10. On CD-AFM bias related to probe bending
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903



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