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You searched on: Author: andras vladar Sorted by: date

Displaying records 1 to 10 of 166 records.
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1. Method for measuring the diameter of polystyrene latex reference spheres by atomic force microscopy
Series: Special Publication (NIST SP)
Report Number: 260-185
Published: 6/30/2016
Authors: John A Dagata, Premsagar Purushotham Kavuri, Andras Vladar, Kensei Ehara, Natalia Farkas, Chung-Lin Wu, Hiroshi Itoh
Abstract: This report presents a correlated height and width measurement model for particle size analysis of spherical particles by atomic force microscopy (AFM). It is complementary to more familiar methods based on a single value of the particle height o ...

2. Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry
Published: 3/22/2016
Authors: John S Villarrubia, Vipin Nagnath Tondare, Andras Vladar
Abstract: The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is des ...

3. Does Your SEM Really Tell the Truth?,How Would You Know? Part 4: Charging and its Mitigation
Published: 1/20/2016
Authors: Michael T Postek, Andras Vladar
Abstract: This is the fourth part of a series of tutorial papers discussing various causes of measurement uncertainty in scanned particle beam instruments. Scanned particle beam instruments especially the scanning electron microscope (SEM) have gone through t ...

4. Strategies for scanning electron microscopy sample preparation and characterization of multiwall carbon nanotube polymer composites
Series: Special Publication (NIST SP)
Report Number: 1200-17
Published: 1/20/2016
Author: Andras Vladar
Abstract: This guideline presents methods for the preparation and investigation of samples of multiwall carbon nanotube-polymer composites by scanning electron microscopy. It is focused on multiwall carbon nanotube epoxy composite, but the strategy shoul ...

5. Nanomanufacturing Concerns about Measurements Made in the SEM Part IV: Charging and its Mitigation
Published: 11/17/2015
Authors: Michael T Postek, Andras Vladar
Abstract: This is the fourth part of a series of tutorial papers discussing various causes of measurement uncertainty in scanned particle beam instruments, and some of the solutions researched and developed at NIST and other research institutions. Scanned part ...

6. Optimizing Hybrid Metrology: Rigorous Implementation of Bayesian and Combined Regression.
Published: 11/12/2015
Authors: Mark Alexander Henn, Richard M Silver, John S Villarrubia, Nien F Zhang, Hui Zhou, Bryan M Barnes, Andras Vladar, Bin Ming
Abstract: Hybrid metrology, e.g. the combination of several measurement techniques to determine critical dimensions, is an important approach to meet the needs of semiconductor industry. A proper use of hybrid metrology may not only yield more reliable estimat ...

7. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Published: 9/10/2015
Authors: Hyeong G. Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar

8. Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library
Published: 7/1/2015
Authors: John S Villarrubia, Andras Vladar, Bin Ming, Regis J Kline, Daniel Franklin Sunday, Jasmeet Chawla, Scott List
Abstract: The width and shape of 10 nm to 12 nm wide lithographically patterned SiO2 lines were measured in the scanning electron microscope by fitting the measured intensity vs. position to a physics-based model in which the lines‰ widths and shapes are param ...

9. NIST-TAPPI Workshop on Measurement Needs for Cellulose Nanomaterial
Series: Special Publication (NIST SP)
Report Number: 1192
Published: 6/23/2015
Authors: Chelsea Simone Davis, Robert J Moon, Sean Ireland, Linda Johnston, Jo Anne Shatkin, Kim Nelson, E. Johan Foster, Aaron M Forster, Michael T Postek, Andras Vladar, Jeffrey W Gilman
Abstract: A one-day workshop focused on the Measurement Needs for Cellulosic Nanomaterials was organized by the National Institute of Standards and Technology and held in conjunction with the 2014 TAPPI International Conference on Nanotechnology for Renewa ...

10. Nanometer level sampling and control of a scanning electron microscope
Published: 6/2/2015
Authors: Bradley N Damazo, Andras Vladar, Olivier Marc Marie-Rose, John A Kramar
Abstract: The National Institute of Standards and Technology (NIST) is developing a specialized, metrology scanning electron microscope (SEM), having a metrology sample stage measured by a 38 picometer resolution, high-bandwidth laser interferometer system. Th ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series