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You searched on: Author: mark vaudin

Displaying records 41 to 50 of 85 records.
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41. Saturation Molalities and Standard Molar Enthalpies of Solution of 2 -Deoxyadenosine H^d2^O(cr), 2 -Deoxycytidine H^d2^O(cr), 2 -Ddeoxyguanosine H^d2^O(cr), 2 -Deoxyinosine(cr), and 2 -deoxyuridine(cr) in H^d2^O(l)
Published: 3/1/2005
Authors: Yadu D. Tewari, Patrick D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830462

42. The Development and Evaluation of TiO^d2^ Nanoparticle Films for Conductometric Gas Sensing on MEMS Microhotplate Platforms
Published: 1/1/2005
Authors: Kurt D Benkstein, Christopher B Montgomery, Mark D Vaudin, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830913

43. Horizontal Growth and In Situ Assembly of Oriented Zinc Oxide Nanowires
Published: 10/1/2004
Authors: Babak Nikoobakht, Chris A Michaels, Stephan J Stranick, Mark D Vaudin
Abstract: The positioning and directed assembly of semiconductor nanowires (NWs) is of considerable current interest for bottom-up approaches to the engineering of intricate structures from nanoscale building blocks. We report a horizontal growth mode for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831361

44. Studies of Deformation Induced Texture Development in Sheet Materials Using Diffraction Techniques
Published: 8/2/2004
Authors: Stephen W Banovic, Mark D Vaudin, Thomas H Gnaupel-Herold, D M. Saylor, K P Rodbell
Abstract: Crystallographic texture measurements were made on a series of rolled aluminum sheet specimens deformed in equi-biaxial tension up to a strain level of 0.11. The measurement techniques used were neutron diffraction with a 4-circle goniometer, electr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853272

45. Saturation molalities and standard molar enthalpies of solution of cytidine(cr), hypoxanthine(cr), thymine(cr), uridine(cr), xanthine(cr) in H^d2^O(l)
Published: 8/1/2004
Authors: Yadu D. Tewari, P D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg
Abstract:
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903196

46. Saturation Molalities and Standard Molar Enthalpies of Solution of Cytidine(cr), Hypoxanthine(cr), Thymidine(cr), Thymine(cr), Uridine(cr), and Xanthine(cr) in H^d2^O(1)
Published: 7/1/2004
Authors: Yadu D. Tewari, Patrick D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg
Abstract: Saturation molalities, m(sat) in H 0(I) have been measure for the substances cytidine(cr), hypoxanthine(cr), thymidine(cr), thymine(cr), uridine(cr), and xanthine(cr) by using h.p.l.c. The states of hydration were established by performing Karl-Fisch ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830449

47. The Development and Evaluation of TiO2 Nanoparticle Films for Conductometric Gas Sensing on MEMS Microhotplate Platforms
Published: 7/1/2004
Authors: Kurt D Benkstein, Christopher B Montgomery, Mark D Vaudin, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903223

48. Combinatorial Investigation of Structural Quality of Au/Ni Contacts on GaN
Published: 6/1/2004
Authors: Albert Davydov, Leonid A Bendersky, William J Boettinger, Daniel Josell, Mark D Vaudin, C S Chang, Ichiro Takeuchi
Abstract: A combinatorial library of Au/Ni metalizations on GaN were microstructurally characterized by x-ray diffraction (XRD), electron back-scattered diffraction (EBSD) and transmission electron microscopy (TEM). The array of single- and bi-layered metal e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853247

49. Phase Evolution of Ba^d2^YCu^d3^O^d6+x^ Films During the BaF^d2^ Process
Published: 3/18/2004
Authors: Winnie K Wong-Ng, Igor Levin, Ron Feenstra, Lawrence P. Cook, Mark D Vaudin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851115

50. Coated Conductors: Phase Relations in the Ba-Y-Cu-F-O-H System
Published: 1/1/2004
Authors: Winnie K Wong-Ng, Lawrence P. Cook, Igor Levin, Mark D Vaudin, J Suh, Ron Feenstra
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850785



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