NIST logo

Publications Portal

You searched on: Author: mark vaudin

Displaying records 41 to 50 of 82 records.
Resort by: Date / Title

41. Studies of Deformation Induced Texture Development in Sheet Materials Using Diffraction Techniques
Published: 8/2/2004
Authors: Stephen W Banovic, Mark D Vaudin, Thomas H Gnaupel-Herold, D M. Saylor, K P Rodbell
Abstract: Crystallographic texture measurements were made on a series of rolled aluminum sheet specimens deformed in equi-biaxial tension up to a strain level of 0.11. The measurement techniques used were neutron diffraction with a 4-circle goniometer, electr ...

42. Saturation molalities and standard molar enthalpies of solution of cytidine(cr), hypoxanthine(cr), thymine(cr), uridine(cr), xanthine(cr) in H^d2^O(l)
Published: 8/1/2004
Authors: Yadu D. Tewari, P D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg

43. Saturation Molalities and Standard Molar Enthalpies of Solution of Cytidine(cr), Hypoxanthine(cr), Thymidine(cr), Thymine(cr), Uridine(cr), and Xanthine(cr) in H^d2^O(1)
Published: 7/1/2004
Authors: Yadu D. Tewari, Patrick D Gery, Mark D Vaudin, Alan D. Mighell, R Klein, Robert Nathan Goldberg
Abstract: Saturation molalities, m(sat) in H 0(I) have been measure for the substances cytidine(cr), hypoxanthine(cr), thymidine(cr), thymine(cr), uridine(cr), and xanthine(cr) by using h.p.l.c. The states of hydration were established by performing Karl-Fisch ...

44. The Development and Evaluation of TiO2 Nanoparticle Films for Conductometric Gas Sensing on MEMS Microhotplate Platforms
Published: 7/1/2004
Authors: Kurt D Benkstein, Christopher B Montgomery, Mark D Vaudin, Stephen Semancik

45. Combinatorial Investigation of Structural Quality of Au/Ni Contacts on GaN
Published: 6/1/2004
Authors: Albert Davydov, Leonid A Bendersky, William J Boettinger, Daniel Josell, Mark D Vaudin, C S Chang, Ichiro Takeuchi
Abstract: A combinatorial library of Au/Ni metalizations on GaN were microstructurally characterized by x-ray diffraction (XRD), electron back-scattered diffraction (EBSD) and transmission electron microscopy (TEM). The array of single- and bi-layered metal e ...

46. Phase Evolution of Ba^d2^YCu^d3^O^d6+x^ Films During the BaF^d2^ Process
Published: 3/18/2004
Authors: Winnie K Wong-Ng, Igor Levin, Ron Feenstra, Lawrence P. Cook, Mark D Vaudin

47. Coated Conductors: Phase Relations in the Ba-Y-Cu-F-O-H System
Published: 1/1/2004
Authors: Winnie K Wong-Ng, Lawrence P. Cook, Igor Levin, Mark D Vaudin, J Suh, Ron Feenstra

48. Saturation Molalities and Standard Molar Enthalpies of Solution of Adenosine (cr), Guanosine. 2H^d2^O(cr), inosine(cr), and Xanthosine. 2H^d2^O(cr) in H^d2^(l)
Published: 10/1/2003
Authors: Yadu D. Tewari, R Klein, Mark D Vaudin, Robert Nathan Goldberg
Abstract: Saturation molalities m(sat) in H^d2^O(l) have been measured for the substances adenosine(cr), guanosine 2H^d2^O(cr), inosine(cr), and xanthosine 2H^d2^O(cr) over the temperature range T = 287.91 K to T = 308.18 K by using h.p.l.c.. The indicated st ...

49. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...

50. Electron Backscattered Diffraction and Energy Dispersive X-ray Spectroscopy Study of the Phase NiSn4
Published: 6/1/2003
Authors: William J Boettinger, Mark D Vaudin, Maureen E Williams, Leonid A Bendersky, W R Wagner
Abstract: Electron backscattered diffraction and energy dispersive X-ray spectroscopy has been performed on a plate-shaped phase formed through the reaction of Sn and Ni during extended thermal cycling tests, on ceramic capacitors have electroplated tin end te ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series