Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: joseph tan

Displaying records 11 to 20 of 46 records.
Resort by: Date / Title


11. Fundamental constants and tests of theory in Rydberg states of hydrogenlike ions
Published: 7/1/2009
Authors: Ulrich D. Jentschura, Peter J Mohr, Joseph N Tan, Benedikt J. Wundt
Abstract: A comparison of precision frequency measurements to quantum electrodynamic (QED) theoretical predictions can be used to test theory and to obtain information regarding fundamental constants. We find that for Rydberg states, theoretical uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900185

12. Fundamental Constants and Tests of Theory in Rydberg States of Hydrogen-like Ions
Published: 4/22/2008
Authors: Ulrich D. Jentschura, Peter J Mohr, Joseph N Tan, B. J. Wundt
Abstract: A comparison of precision frequency measurements to quantum electrodynamics (QED) predictions for Rydberg states of hydrogen-like ions can yield information on values of fundamental constants and test theory. With the results of a calculation of a ke ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904182

13. Spectra of W^u39+^-W^u47+^ in the 12 nm to 20 nm Region Observed With an EBIT Light Source
Published: 10/14/2007
Authors: Yuri Ralchenko, Joseph Reader, Joshua M Pomeroy, Joseph N Tan, John D Gillaspy
Abstract: We observed spectra of highly ionized tungsten in the extreme ultraviolet with an electron beam ion trap (EBIT) and a grazing incidence spectrometer at the National Institute of Standards and Technology. Stages of ionization were distinguished by var ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840893

14. Chen et al. ReplyThe 3C / 3D Line Ratio in Nixix: New Ab Initio Theory and Experimental Results [Physical Review Letters 97, 143201 (2006)]
Published: 9/7/2007
Authors: G X Chen, K P Kirby, E Silver, N Brickhouse, John D Gillaspy, Joseph N Tan, Joshua M Pomeroy, J M Laming
Abstract: No abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840888

15. EUV Spectroscopy of Highly Charged Xenon Ions Created Using an Electron Beam Ion Trap
Published: 3/27/2007
Authors: K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M Pomeroy, Joseph N Tan, John D Gillaspy
Abstract: At the NIST Electron Beam Ion Trap (EBIT), extreme-ultraviolet spectra of xenon ions have been recorded using a flat-field spectrometer. The electron beam energy was varied from 180 eV to 8 keV and radiation from charge states Xe6+ to Xe43+ was obser ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840845

16. Data Acquisition System Development for the Detection of X-Ray Photons in Multi-Wire Gas Proportional Counters
Published: 1/1/2007
Authors: J A Kimpton, M N Kinnane, L F Smale, Christopher T. Chantler, Lawrence T Hudson, Albert Henins, Csilla Ibolya Szabo-Foster, John D Gillaspy, Joseph N Tan, Joshua M Pomeroy, E Takacs, B Radics
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100999

17. Detection of Faint X-Ray Spectral Features Using Wavelength, Energy, and Spatial Discrimination Techniques
Published: 1/1/2007
Authors: Lawrence T Hudson, John D Gillaspy, Joshua M Pomeroy, Csilla Ibolya Szabo-Foster, Joseph N Tan, B Radics, E Takacs, Christopher T. Chantler, J A Kimpton, M N Kinnane, L F Smale
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100952

18. Detection of faint X-ray spectral features using wavelength, energy, and spatial discrimination techniques
Published: 1/1/2007
Authors: Lawrence T Hudson, John D Gillaspy, Joshua M Pomeroy, Csilla Ibolya Szabo-Foster, Joseph N Tan, B Radics, E Takacs, Christopher T. Chantler, J A Kimpton, M N Kinnane, L F Smale
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101844

19. Detection of faint X-ray spectral features using wavelength, energy, and spatial discrimination techniques
Published: 1/1/2007
Authors: Lawrence T Hudson, John D Gillaspy, Joshua M Pomeroy, Csilla Ibolya Szabo-Foster, Joseph N Tan, B Radics, E Takacs, Christopher T. Chantler, J A Kimpton, M N Kinnane, L F Smale
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=106883

20. Extreme-ultraviolet spectroscopy of highly charged xenon ions created using an electron-beam ion trap
Published: 1/1/2007
Authors: K Fahy, E Sokell, G O'Sullivan, A Aguilar, Joshua M Pomeroy, Joseph N Tan, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101828



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series