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Author: john stoup

Displaying records 21 to 30 of 32 records.
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21. Video-Based Metrology
Published: 1/1/2002
Authors: Theodore D Doiron, John Richard Stoup, Marilyn N. Abrams, Tsai Hong Hong
Abstract: Video cameras are increasingly used to make dimensional measurements. Many of these systems use interpolation of the pixel data, with some systems claiming to find edges with precision of l/100 of a pixel. We have studied the response of single pixel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821741

22. Accuracy and Versatility of the NIST M48 Coordinate Measuring Machine
Published: 10/1/2001
Authors: John Richard Stoup, Theodore D Doiron
Abstract: The NIST Is continuing to develop the ability to perform accurate, traceable measurements on a wide range of artifacts using a very precise, error-mapped coordinate measuring machine (CMM). The NIST M48 CMM has promised accuracy and versatility for m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822439

23. Video Based Metrologly
Published: 12/1/2000
Authors: Theodore D Doiron, Tsai Hong Hong, John Richard Stoup, Marilyn N. Abrams
Abstract: Video cameras are increasingly used to make dimensional measurements. Many of these systems use interpolation of the pixel data, with some systems claiming to find edges with precision of 1/100 of a pixel. We have studied the response of single pix ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821728

24. Video Based Metrology
Published: 6/1/2000
Authors: Theodore D Doiron, John Richard Stoup, Tsai Hong Hong, Marilyn N. Abrams
Abstract: With the rapid growth of video-based measurement and inspection systems, we would like to determine the extent to which industry needs calibration artifacts and standardized methods for video metrology. We hope to open a dialog among users for discu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820667

25. NORAMET Comparison of Gauge Block Measurement by Optical Interferometry
Published: 10/1/1999
Authors: Jennifer Decker, A Lapointe, John Richard Stoup, M V Alonso, J R Pekelsky
Abstract: A varied assortment of 47 new and used steel, ceramic, chromium carbide and tungsten carbide gauge blocks from 9 manufacturers, ranging in length from 05. mm to 101.6  mm were calibrated by four laboratories from the NORAMET countries using the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820925

26. Case Against Optical Gauge Block Metrology
Published: 9/1/1998
Authors: Theodore D Doiron, Dennis S Everett, Bryon S. Faust, Eric S Stanfield, John Richard Stoup
Abstract: The current definition of length of a gage block is a very clever attempt to evade the systematic errors associated with the wringing layer thickness and optical phase corrections. In practice, there are very large systematic operator and surface eff ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820890

27. Minimizing Error Sources in Gage Block Mechanical Comparison Measurements
Published: 9/1/1998
Authors: Bryon S. Faust, John Richard Stoup, Debra K Stanfield
Abstract: Error sources in gage block mechanical comparisons can range from classical textbook examples (thermal gradients, correct temperature value, and correct master value) to a completely counter-intuitive example of diamond probe tip wear at low applied ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820895

28. Minimizing Errors in Phase Change Correction Measurements for Gage Blocks Using a Spherical Contact Techniques
Published: 9/1/1998
Authors: John Richard Stoup, Bryon S. Faust, Theodore D Doiron
Abstract: One of the most elusive measurement elements in gage block interferometry is the correction for the phase change on reflection. Techniques used to quantify this correction have improved over the years, but the measurement uncertainty has remained rel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820914

29. High-Resolution, High-Accuracy, Mid-IR (450 cm^u-1^ {less than or equal to} {omega} {less than or equal to} 4000 cm^u-1^) Refractive Index Measurements in Silicon
Published: 3/1/1998
Authors: Deane Chandler-Horowitz, Paul M. Amirtharaj, John Richard Stoup
Abstract: The real and imaginary part of the refractive index of silicon, n({omega}) and k({omega}), have been measured by using Fourier Transform Infrared (FTIR) transmission spectral data from a double-sided-polished IC grade Si wafer. An accurate independe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=9825

30. Uncertainty and Dimensional Calibrations
Published: 11/1/1997
Authors: Theodore D Doiron, John Richard Stoup
Abstract: The calculation of uncertainty for a measurement is an effort to set reasonable bounds for the measurement result according to standardized rules. Since every measurement produces only an estimate of the answer, the primary requisite of an uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820840



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