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Author: richard silver

Displaying records 101 to 110 of 112 records.
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101. Optical Overlay Metrology at NIST
Published: 1/1/1996
Authors: Richard M Silver, Amy Singer, L Carroll, S Berg-cross, James Edward Potzick
Abstract: Many of the significant challenges in making accurate overlay registration measurements are discussed. An understanding of the causes of the errors affecting these measurements is a prerequisite to improving accuracy and also for the design of standa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820818

102. Delineation of pn Junctions by Scanning Tunneling Microscopy/Spectroscopy in Air and Ultra High Vacuum
Published: 6/1/1995
Authors: Richard M Silver, John A. Dagata, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29181

103. Delineation of pn Junctions by Scanning Tunneling Microscopy/Spectroscopy in Air and Ultrahigh Vacuum
Published: 5/1/1995
Authors: Richard M Silver, John A. Dagata, H. W. Tseng
Abstract: Lateral dopant profiling of cleaved, passivated abrupt GaAs pn junctions using scanning tunneling microscopy/spectroscopy is demonstrated both in ultrahigh vacuum and air. A combination of forward-and reverse-bias imaging and position-dependent tunn ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820764

104. Metrology with the Ultraviolet Scanning Transmission Microscope
Published: 5/1/1995
Authors: Richard M Silver, James Edward Potzick, Y Hu
Abstract: A novel design for an ultraviolet critical dimension measurement transmission microscope utilizing the Stewart platform as the rigid main structure has been implemented. This new design shows improved vibration characteristics and is able to accommod ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820765

105. Overlay Measurements and Standards
Published: 5/1/1995
Authors: Richard M Silver, James Edward Potzick, Robert D. Larrabee
Abstract: The relative misalignment of features produced by different mask levels (i.e., overlay error) is projected to become an increasingly important problem to the semiconductor industry as the size of the critical features continues to decrease. In respon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820766

106. Air and Vacuum STM/S of Bulk-Doped GaAs and pn Junctions
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/1/1994
Authors: Richard M Silver, John A. Dagata, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20047

107. Ambient and Vacuum Scanning Tunneling Spectroscopy of Sulfur and Oxygen-Terminated Gallium Arsenide
Published: 11/1/1994
Authors: Richard M Silver, John A. Dagata, H. W. Tseng
Abstract: Tunneling spectroscopy of sulfur- and oxygen-terminated n- and p-type GaAs (110) surfaces is reported for air and ultrahigh-vacuum conditions. Simulations of the complete I-V characteristics with explicit inclusion of surface states within the planar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820713

108. Ambient and Vacuum Scanning Tunneling Spectroscopy of Sulfur- and Oxygen-Terminated Gallium Arsenide
Published: 11/1/1994
Authors: Richard M Silver, John A. Dagata, W. F. Tseng
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25904

109. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 2/1/1994
Authors: W. F. Tseng, John A. Dagata, Richard M Silver, Joseph Fu, J R. Lowney
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13544

110. Junction Locations by Scanning Tunneling Microscopy: In-Air-Ambient Investigation of Passivated GaAs pn Junctions
Published: 9/5/1993
Authors: H. W. Tseng, John A. Dagata, Richard M Silver, Joseph Fu, J R. Lowney
Abstract: Scanning tunneling microscopy (STM) and atomic force microscopy operating in air have been used to investigate locations of molecular-beam epitaxially grown GaAs multiple pn junctions cleaved and passivated with P(2)S(5). Symmetrically and asymmetric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820723



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