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Author: daniel sawyer

Displaying records 11 to 20 of 26 records.
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11. Design and Fabrication of an Operating Room Computer Assisted Orthopaedic Hip Surgery Artifact
Published: 8/17/2007
Authors: Nicholas G Dagalakis, Yong Sik Kim, Daniel S Sawyer, Craig M Shakarji
Abstract: Hundreds of thousands of joint arthroplasty operations are performed throughout the world every year providing life saving relief from pain and return of mobility to the majority of the individuals who have this treatment. Clinical studies have show ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823614

12. Laser Tracker Testing at NIST Using the ASME B89.4.19 Standard
Published: 1/1/2007
Authors: Balasubramanian Muralikrishnan, Christopher J Blackburn, Daniel S Sawyer, Bruce R. Borchardt, William Tyler Estler, Steven David Phillips
Abstract: While the versatility and economics of laser trackers are quite appealing, the ability to assess their accuracy and to compare various brands has been limited by a lack of a national or international standard that encompasses testing and traceability ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824608

13. Large-Scale Metrology Instrument Performance Evaluations at NIST
Published: 1/1/2006
Authors: William Tyler Estler, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips
Abstract: The ASME B89 Committee on Dimensional Metrology has approved a new American National Standard B89.4.19 - Performance Evaluation of Laser Based Spherical Coordinate Measurement Systems. This Standard, to be published in 2006, specifies test methods fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824607

14. Recent Developments in the Standardization and Testing of Laser Trackers
Published: 1/1/2006
Authors: Daniel S Sawyer, Steven David Phillips, Bruce R. Borchardt, William Tyler Estler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823203

15. Validation of CMM Task Specific Measurement Uncertainity Software
Published: 8/1/2003
Authors: M P Henke, J M Baldwin, K Summerhays, B Rasnick, P Murray, Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Craig M Shakarji
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. REcently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822066

16. The Validation of CMM Task Specific Measurement Uncertainty Software
Published: 1/1/2003
Authors: Steven David Phillips, Bruce R. Borchardt, A Abackerli, Craig M Shakarji, Daniel S Sawyer, P Murray, B Rasnick, K Summerhays, J M Baldwin, M P Henke
Abstract: Task specific CMM measurement uncertainty statements can be generated using computer (Monte Carlo) simulation. Recently, commercial products using this powerful technique have become available; however they typically involve megabytes of code inacces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822036

17. A Laser Tracker Calibration System
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

18. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2001
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, D E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824606

19. A Novel Artifact for Testing Large Coordinate Measuring Machines
Published: 1/1/2000
Authors: Steven David Phillips, Daniel S Sawyer, Bruce R. Borchardt, David E Ward, D E Beutel
Abstract: We present a high accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use purely optical methods such as laser interferometers. The system can be use ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820971

20. A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty
Published: 1/1/1999
Authors: Steven David Phillips, Bruce R. Borchardt, Daniel S Sawyer, William Tyler Estler, K Eberhardt, M Levenson, Marjorie A McClain, Ted Hopp
Abstract: We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. T ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820941



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