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You searched on: Author: lee richter

Displaying records 71 to 80 of 96 records.
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71. Correlation of Molecular Orientation with Adhesion at Polystyrene/Soild Interfaces
Published: 9/1/2002
Authors: P T. Wilson, Lee J Richter, William E Wallace, Kimberly A Briggman, John Carter Stephenson
Abstract: Vibrationally resonant sum-frequency generation (VR-SFG) has been used to characterize the molecular orientation of the phenyl groups at the interface between polystyrene (PS) films and surface-modified glass substrates. Both the interface structure ...

72. Selective Study of Polymer/Dielectric Interfaces with Vibrationally Resonant Sum Frequency Generation Via Thin-Film Interference
Published: 4/1/2002
Authors: P T. Wilson, Kimberly A Briggman, William E Wallace, John Carter Stephenson, Lee J Richter
Abstract: A new technique for selective characterization of the structure of free and buried thin film interfaces by vibrationaly resonant sum frequency generation spectroscopy is described. Manipulation of Fressnel coefficients by choice of film thickness on ...

73. Vibrational Signatures of Polyethylene Glycol and Brighteners on Copper
Published: 2/1/2002
Authors: B C Baker, Clayton S. Yang, Lee J Richter, Thomas P Moffat
Abstract: With the use of fourier transform infrared spectroscopy (FTIR) and sum frequency generation spectroscopy (SFG), the surface coverage and confirmation of additives often used in copper deposition are identified on copper surfaces. Ex situ experiments ...

74. Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy
Published: 4/23/2001
Authors: P T. Wilson, Kimberly A Briggman, John Carter Stephenson, William E Wallace, Lee J Richter
Abstract: Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried i ...

75. Absolute Molecular Orientational Distribution of the Polystyrene Surface
Published: 4/1/2001
Authors: Kimberly A Briggman, John Carter Stephenson, William E Wallace, Lee J Richter
Abstract: Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characteriza ...

76. Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles
Published: 3/1/2001
Authors: A Liu, A Rahmani, Garnett W Bryant, Lee J Richter, Stephan J Stranick
Abstract: We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An ext ...

77. Imaging and Autocorrelation of Ultrafast Infrared Laser Pulses in the 3-11 {mu} Range With Silcon CCD Cameras and Photodiodes
Published: 2/15/2001
Authors: Kimberly A Briggman, Lee J Richter, John Carter Stephenson
Abstract: Standard silicon photodiodes and CCD cameras are convenient and inexpensive alternatives to cryogenically cooled diodes or arrays for autocorrelation and imaging of ultrafast infrared (IR) laser pulses in the wavelength range 3-11 {mu}. The response ...

78. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H. Gnaeupel-Herold, Henry Joseph Prask, Charles F Majkrzak, Norman F. Berk, John Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

79. Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces
Published: 11/1/2000
Authors: Clayton S. Yang, Lee J Richter, Kimberly A Briggman, John Carter Stephenson, Thomas P Moffat, Gery R Stafford
Abstract: In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semicon ...

80. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...

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