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Author: lee richter

Displaying records 71 to 80 of 93 records.
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71. Molecular Order at Polymer Interfaces Measured by Broad-Bandwidth Vibrationally Resolved Sum Frequency Generation Spectroscopy
Published: 4/23/2001
Authors: P T. Wilson, Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Broad-bandwidth vibrationally-resolved sum frequency generation spectroscopy has been used to measure the molecular orientation distribution at polystyrene/dielectric interfaces. A novel microcavity structure allows isolation of the free or buried i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831222

72. Absolute Molecular Orientational Distribution of the Polystyrene Surface
Published: 4/1/2001
Authors: Kimberly A Briggman, John C. Stephenson, William E Wallace III, Lee J Richter
Abstract: Vibrationally-resonant sum frequency generation (VR-SFG) has been used to study the absolute molecular orientational distribution of the pendant phenyl groups at the free surface of polystyrene (PS) thin films on oxidized Si substrates. Characteriza ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841486

73. Modeling Illumination-Mode Near-Field Optical Microscopy of Au Nanoparticles
Published: 3/1/2001
Authors: A Liu, A Rahmani, Garnett W Bryant, Lee J Richter, Stephan J Stranick
Abstract: We present a theoretical analysis of near-field scanning optical microscopy (NSOM) images of small Au particles made in illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and an aluminum coating. An ext ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840936

74. Imaging and Autocorrelation of Ultrafast Infrared Laser Pulses in the 3-11 {mu} Range With Silcon CCD Cameras and Photodiodes
Published: 2/15/2001
Authors: Kimberly A Briggman, Lee J Richter, John C. Stephenson
Abstract: Standard silicon photodiodes and CCD cameras are convenient and inexpensive alternatives to cryogenically cooled diodes or arrays for autocorrelation and imaging of ultrafast infrared (IR) laser pulses in the wavelength range 3-11 {mu}. The response ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841452

75. Abstracts for the MSEL Assessment Panel, March 2001
Published: 1/26/2001
Authors: Leslie E Smith, Alamgir Karim, Leonid A Bendersky, C Lu, J J Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K Tewary, Davor Balzar, G A Alers, Stephen E Russek, Charles C. Dr. Han, Haonan Wang, William E Wallace III, Daniel A Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G Barker, Charles J. Glinka, Eric K Lin, Ward L Johnson, Paul R Heyliger, David Thomas Read, R R Keller, J Blendell, Grady S White, Lin-Sien H Lum, Eric J Cockayne, Igor Levin, C E Johnson, Maureen E Williams, Gery R Stafford, William J Boettinger, Kil Won Moon, Daniel Josell, Daniel Wheeler, Thomas P Moffat, W H Huber, Lee J Richter, Clayton S. Yang, Robert D Shull, R A. Fry, Robert D McMichael, William F. Egelhoff Jr., Ursula R Kattner, James A Warren, Jonathan E Guyer, Steven P Mates, Stephen D Ridder, Frank S. Biancaniello, D Basak, Jon C Geist, Kalman D Migler
Abstract: Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850052

76. Sum Frequency Spectroscopy Studies of Adsorption of Additives on Metal/Electrolyte Interfaces
Published: 11/1/2000
Authors: Clayton S. Yang, Lee J Richter, Kimberly A Briggman, John C. Stephenson, Thomas P Moffat, Gery R Stafford
Abstract: In situ and ex situ VR-SFG studies of mercaptopropylsulfonate (MPSA) molecules adsorbed on metal/electrolyte interfaces prove the molecular conformation is sensitive to hydration. MPSA catalyses electrodeposition of copper interconnection for semicon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831234

77. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831196

78. Scanning Near-Field Infared Microscopy and Spectroscopy with a Broadband Laser Source
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field scanning optical microscopy (NSOM) is a powerful tool for the characterization of the optical properties of nanoscale objects, although pervasive artifacts often create difficulties in image interpretation. A three dimensional scanning NS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831210

79. Scanning Near-Field Infrared Microscopy and Spectroscopy With a Broadband Laser Source
Published: 10/1/2000
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: A scanning near-field microscopy that allows the fast acquisition of mid-infrared absorption spectra is described. The microscope couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of vibrational spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831169

80. Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
Published: 9/1/2000
Authors: Chris A Michaels, C EJ Dentinger, Lee J Richter, D B Chase, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831194



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