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You searched on: Author: lee richter

Displaying records 91 to 96.
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91. Depletion-Electric-Field-Induced Second-Harmonic Generation Near Oxidized GaAs(001) Surfaces
Published: 4/15/1997
Authors: T A Germer, K Kolasinski, J C Stephenson, Lee J Richter

92. Femtosecond Laser-Induced Desorption of CO from (Cu100): Comparison of Theory and Experiment
Published: 12/1/1996
Authors: L M Struck, Lee J Richter, Steven A Buntin, Richard R Cavanagh, J C Stephenson

93. Enhanced Near-Field Raman Spectroscopy
Published: Date unknown
Authors: C EJ Dentinger, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: Near-field Raman spectroscopy can be used to obtain chemical specificity with the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). We report detailed measurements of near-field Raman spectra from a single crystal di ...

94. In-Situ Ellipsometric Study of the Competitive Adsorption of PEG-/CI-/(SPS/MPS) on Cu
Published: Date unknown
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: The adsorption of Cu electrodeposition accelerating agents SPS and MPS on evaporated Cu thin films was examined in-situ using spectroscopic ellipsometry under quiescent conditions. Both the thiol (MPS) and disulfide (SPS) resulted in definitive chan ...

95. Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy
Published: Date unknown
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of ...

96. Potential Dependence of Competitive Adsorption of PEG, Cl^u-^, and SPS/MPS on Cu: An In Situ Ellipsometric Study
Published: Date unknown
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Potential dependent adsorption of bis- (3-sodiumsulfopropyl disulfide) (SPS), 3-mercaptopropyl sulfonate (MPS), Cl , and polyethylene glycol (PEG) on evaporated Cu thin films was examined using in-situ spectroscopic ellipsometry at 0.65 VMSE, -0.75 ...

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