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Author: lee richter

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91. In-Situ Ellipsometric Study of the Competitive Adsorption of PEG-/CI-/(SPS/MPS) on Cu
Published: Date unknown
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: The adsorption of Cu electrodeposition accelerating agents SPS and MPS on evaporated Cu thin films was examined in-situ using spectroscopic ellipsometry under quiescent conditions. Both the thiol (MPS) and disulfide (SPS) resulted in definitive chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831415

92. Nanoscale Chemical Imaging With Scanning Near-Field Infrared Microscopy
Published: Date unknown
Authors: Chris A Michaels, Stephan J Stranick, Lee J Richter, Richard R Cavanagh
Abstract: The development of a near-field microscope that utilizes infrared absorption as the optical contrast mechanism will be described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specificity of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831093

93. Potential Dependence of Competitive Adsorption of PEG, Cl^u-^, and SPS/MPS on Cu: An In Situ Ellipsometric Study
Published: Date unknown
Authors: Marlon L Walker, Lee J Richter, Thomas P Moffat
Abstract: Potential dependent adsorption of bis- (3-sodiumsulfopropyl disulfide) (SPS), 3-mercaptopropyl sulfonate (MPS), Cl , and polyethylene glycol (PEG) on evaporated Cu thin films was examined using in-situ spectroscopic ellipsometry at 0.65 VMSE, -0.75 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831418



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