Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: michael postek

Displaying records 201 to 210 of 236 records.
Resort by: Date / Title

201. Traceable Standards for Scanning Electron Microscopy
Published: 1/1/1994
Author: Michael T Postek
Abstract: The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and ...

202. X-Ray Mask Metrology: The Development of Linewidth Standards for X-Ray Lithography
Published: 12/31/1993
Authors: Michael T Postek, J R. Lowney, Andras Vladar, William J. Keery, E Marx, Robert D. Larrabee

203. Comparisons of Measured Linewidths of Sub-Micrometer Lines Using Optical, Electrical, and SEM Metrologies
Published: 9/1/1993
Authors: Richard A Allen, P. Troccolo, James C. OwenI II, James Edward Potzick, Michael T Postek, Loren W. Linholm

204. X-Ray Lithography Mask Metrology: Use of Transmitted Electrons in an SEM for Linewidth Measurement
Series: Journal of Research (NIST JRES)
Published: 8/1/1993
Authors: Michael T Postek, J R. Lowney, Andras Vladar, William J. Keery, E Marx, Robert D. Larrabee

205. Cryopump Vibration Isolation System for an SEM
Published: 12/31/1991
Authors: Michael T Postek, William J. Keery

206. Microchannel-Plate Detection Systems for Low Accelerating Voltage SEM
Published: 12/31/1991
Author: Michael T Postek

207. SEM Imaging and Metrology at Low Accelerating Voltages Using Backscattered Electrons
Published: 12/31/1991
Author: Michael T Postek

208. STM Pattern Generation on Silicon and GaAs Surfaces
Published: 12/31/1991
Authors: John A Dagata, J. Schneir, Howard H. Harary, C J Evans, Michael T Postek, J. Bennett, W. F. Tseng

209. The Application of Transmission Electron Detection to X-ray Mask Calibrations and Inspection
Published: 12/31/1991
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery, E Marx

210. Submicrometer Critical Dimensional Metrology
Published: 12/1/1991
Authors: Robert D. Larrabee, Loren W. Linholm, Michael T Postek

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series