Publications Portal

You searched on:
Author: james porto

Displaying records 31 to 40 of 54 records.
Resort by: Date / Title

31. Broad Band, High Resolution Spectroscopy of Highly Charged Ions with a microcalorimeter on an Electron Beam Ion Trap
Published: 1/1/2002
Authors: E H Silver, H W Schnopper, S Bandler, N Brickhouse, S Murray, M Barbera, E Takacs, John D Gillaspy, James V Porto, I Kink, L P. Ratliff, Lawrence T Hudson, J M Laming, N Madden, D Landis, J Beeman, E E Haller, R Schuch
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102911

32. Series Solution for the Image Charge Fields in Arbitrary Cylindrically Symmetric Penning Traps
Published: 8/1/2001
Author: James V Porto
Abstract: I present a series solution to the image charge fields of a single ion in a Penning trap. The calculation of these fields and resulting frequency shifts will be important for advances in a variety of high precision Penning trap studies, particularly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840482

33. Analysis of Broadband X-Ray Spectra of Highly Charged Krypton From a Microcalorimeter Detector of an Electron-Beam Ion Trap
Published: 4/1/2001
Authors: I Kink, J M Laming, E Takacs, James V Porto, John D Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, N. Madden, D Landis, J. Beeman, E. E. Haller
Abstract: Spectra of highly charged Kr ions, produced in an EBIT, have been recorded in a broad x-ray energy band (0.3-4 keV) with a microcalorimeter detector. Most of the spectral lines have been identified as transitions of B- to Al-like Kr. The transition ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840443

34. Analysis of Broad Band X-Ray Spectra of Highly Charged Krypton From a Microcalorimeter Detector on an EBIT
Published: 1/1/2001
Authors: I Kink, J M Laming, E Takacs, James V Porto, John D Gillaspy, E Silver, H W Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, N Madden, D Landis, J Beeman, E E Haller
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102240

35. Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions
Published: 1/1/2001
Authors: I Kink, J M Laming, E Takacs, James V Porto, John D Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, D Landis, J. Beeman, E. E. Haller
Abstract: Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad x-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been comple ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840472

36. Emission-Line Intensity Ratios in FeXVII Observed with a Microcalorimeter on an Electron Beam Ion Trap
Published: 12/1/2000
Authors: J M Laming, I Kink, E Takacs, James V Porto, John D Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, N Brickhouse, S Murray, M Barbera, A K Bhatia, G. A. Doschek, N. Madden, D Landis, J. Beeman, E. E. Haller
Abstract: We report new observations of emission line intensity ratios of Fe XVII under controlled experimental conditions, using the National Institute of Standards and Technology electron beam ion trap (EBIT) with a microcalorimeter detector. . . .Both R-mat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840595

37. Laboratory Astrophysics Survey of Key X-Ray Diagnostic Lines Using a Microcalorimeter on an Electron Beam Ion Trap
Published: 9/1/2000
Authors: E Silver, H. Schnopper, Simon R. Bandler, N Brickhouse, S Murray, M Barbera, E Takacs, John D Gillaspy, James V Porto, I Kink, J M Laming, N. Madden, D Landis, J. Beeman, E. E. Haller
Abstract: Cosmic plasma conditions created in an Electron Beam Ion Trap (EBIT) make it possible to simulate the dependencies of Key diagnostic x-ray lines on density, temperature, and excitation conditions that exist in astrophysical sources. We used a microc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840413

38. Direct Imaging of Highly Charged Ions in an Electron Beam Ion Trap
Published: 8/1/2000
Authors: James V Porto, I Kink, John D Gillaspy
Abstract: We have directly observed the ion cloud distribution in an electron beam ion trap using visible and ultraviolet fluorescence from lines in the ground term of Ar^u13+^,^ Xe^u31+^ and Xe^u32+^ ions. Using a gated intensified charge coupled device came ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840406

39. UV Light From the Ground Term of Ti-Like Ytterbium, Tungsten, and Bismuth
Published: 5/1/2000
Authors: James V Porto, John D Gillaspy
Abstract: We have used an electron beam ion trap (EBIT) to measure the wavelength of the J=2 to j=3 magnetic dipole transition in the 3d^u4^ ground term of Ti-like Ytterbium and Tungsten. These results extend the range of measurements of this line along the i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840390

40. Direct Imaging of Static and Dynamic Ion Cloud Distributions in an Electron Beam Ion Trap
Published: 2/1/2000
Author: James V Porto
Abstract: We have used long-lived uv transitions in the ground term of Ars^d13+^, Xe^d31+^ and Xe^d32+^ to directly image highly charged ions within an electron beam ion trap (EBIT). Using an intensified CCD camera, we have the capability to measure both stati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840427