NIST logo

Publications Portal

You searched on:
Author: leticia pibida
Sorted by: title

Displaying records 1 to 10 of 47 records.
Resort by: Date / Title


1. A High Speed Quantum Communication Testbed
Published: 1/1/2002
Authors: Carl J Williams, X Tang, M Hiekkero, J Rouzaud, R Lu, A Goedecke, Alan L Migdall, A Mink, A Nakassis, Leticia S Pibida, J Wen, Edward Walter Hagley, Charles W Clark
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104806

2. A Liquid-Scintillation-based Primary Standardization of 210Pb
Published: 12/1/2007
Authors: L Laureano-p{eacute}rez, R Coll{eacute}, Ryan P Fitzgerald, Iisa Outola, Leticia S Pibida
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100977

3. A New Primary Standardization of Th-229
Published: 1/7/2010
Authors: Ryan P Fitzgerald, Lizbeth Laureano-Perez, Michelle M. Hammond, Leticia S Pibida, Svetlana Nour, Brian Edward Zimmerman
Abstract: The National Institute of Standards and Technology (NIST) has certified a high-purity Th-229 Standard Reference Material as SRM 4328C, based on live-timed 4-pi alpha,beta-gamma anticoincidence counting (LTAC) of the equilibrium solution. The LTAC sy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903482

4. Advances in Radiation Detection Technologies for Responders
Published: 1/1/2005
Authors: Michael P Unterweger, Leticia S Pibida
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103377

5. Calibration of HPGe Gamma-ray Detectors for Measurement of Radioactive Noble Gas Sources
Published: 1/1/2006
Authors: Leticia S Pibida, S S Nafee, Michael P Unterweger, Michelle M. Hammond, Lisa R Karam, I Abbas m
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101346

6. Calibration of traceable solid mock I-131 phantoms used in an international SPECT image quantification comparison
Series: Journal of Research (NIST JRES)
Report Number: 118.017
Published: 8/15/2013
Authors: Brian Edward Zimmerman, Leticia S Pibida, Lynne Emily King, Denis E Bergeron, Jeffrey T Cessna, Matthew Merril Mille
Abstract: The International Atomic Energy Agency (IAEA) has organized an international comparison to assess Single Photon Emission Computed Tomography (SPECT) image quantification capabilities in 12 countries. Iodine-131 was chosen as the radionuclide for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913572

7. Comparison of Resonance Ionization Mass Spectrometry Systems for the Determination of ^u135^Cs/^u137^Cs Isotope Ratios, edited by C.W. Wilkerson
Published: 1/1/2002
Authors: Leticia S Pibida, C A McMahon, W N{omlat}rtersh{amlat}user, B A Bushaw
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103614

8. Comparison of Resonance Ionization Mass Spectrometry Systems for the Determination of ^u135^Cs/^u137^Cs Ratios
Published: Date unknown
Authors: Leticia S Pibida, C A McMahon, W Nortershauser, B A Bushaw
Abstract: The performance of the Resonance Ionization Mass Spectrometry (RIMS) system at the National Institute of Standards and Technology (NIST) has been compared to a similar system at Pacific Northwest National Laboratory (PNNL). Efficiency and selectivit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840556

9. Development of Gamma-ray Emitting Test Sources for Portal Monitors
Published: 1/1/2006
Authors: Leticia S Pibida, Michael P Unterweger, Lisa R Karam
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103291

10. Development of a Glow-Discharge Resonance-Ionization Mass-Spectrometer System for Detector of Radioisotopes in Environmental Samples, ed. by F. Vedel, R.M. Pick, and C. Bastian
Published: 1/1/1999
Authors: Leticia S Pibida, J M Hutchinson, J Wen
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103619



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series