NIST logo

Publications Portal

You searched on:
Author: john messina
Sorted by: title

Displaying records 1 to 10 of 42 records.
Resort by: Date / Title


1. An External Stopwatch for Measuring the Timing of Events in a Computer or Distributed Computing Environment
Published: 9/24/2005
Authors: Eric D Simmon, YaShian Li-Baboud, John V Messina
Abstract: The semiconductor industry continues to strive for improvements in the fabrication process. The Advanced Process Control (APC) systems supporting the fabrication process are steadily becoming more complex in order to deal with the high levels of auto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32079

2. Automating Thermo-Mechanical Warpage Estimation of PCBs/PCAs using a Design-Analysis Integration Framework
Published: 8/18/2006
Authors: Manas Bajaj, Russell Peak, Dirk Zwemer, Thomas Thurman, Lothar Klein, Giedrius Liutkus, Kevin G Brady, John V Messina, Mike Dickerson
Abstract: Accurate prediction, validation and reduction of thermally-induced PCB warpage are critical for enhancing manufacturing yield and reliability in time-to-market driven electronics product realization. In this paper, we describe a methodology to simula ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32287

3. Changing Environmental Regulations and the Electronics Industry
Published: 11/10/2010
Authors: John V Messina, Eric D Simmon, Kevin G Brady
Abstract: In 2008, the European Union (EU) started a major review of its new class of environmental regulations with a broad review of the Restriction of Hazardous Substances (RoHS) and the Waste Electrical and Electronic Equipment (WEEE) Directives. The RoHS/ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906558

4. Cloud Computing and Supply Chain Management
Published: 5/27/2010
Author: John V Messina
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907092

5. Collaborative Augmented Reality for Better Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7441
Published: 8/15/2007
Authors: Matthew L Aronoff, John V Messina
Abstract: Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex -- including not only textual descriptions, but CAD models, diagnostic data, process control dat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32632

6. Collaborative Augmented Reality for Better Standards
Published: 7/1/2007
Authors: Matthew L Aronoff, John V Messina
Abstract: Concurrent engineering depends on clear communication between all members of the development process. As that communication becomes more and more complex, the quality of the standards used to move and understand that information likewise becomes more ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32769

7. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 7/1/2007
Authors: Eric D Simmon, John V Messina
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32621

8. Data Modeling to Support Environmental Information Exchange Throughout the Supply Chain
Published: 8/11/2007
Authors: John V Messina, Eric D Simmon
Abstract: With an ever-increasing awareness of the environmental impact of manufacturing, more and more political organizations (countries, states, and unions) are enacting legislation designed to protect the environment. One category of this restrictive legis ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901689

9. Design and Development of a Dictionary Translator
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6219
Published: 1/1/1999
Authors: John V Messina, James A St. Pierre, Michael R. McCaleb
Abstract: The lack of a traceable set of terminologies to describe electronic components has long been identified by the electronic industry as a significant problem. As part of its Electronic Commerce of Component Information (ECCI) project, NIST's Elec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1065

10. Drivers for Environmental Information Exchange: A Electronics Manufacturing Perspective
Published: 10/20/2009
Author: John V Messina
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907089



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series