NIST logo

Publications Portal

You searched on:
Author: ryna marinenko
Sorted by: title

Displaying records 1 to 10 of 34 records.
Resort by: Date / Title


1. A Study of an Yttria-Doped-Zirconia Coating with Electron Microprobe Wavelength Dispersive Compositional Mapping
Published: 12/1/1997
Authors: Ryna B. Marinenko, David S. Bright, Eric B Steel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100360

2. AlGaAs Composition Measurements from In Situ Optical Reflectance
Published: 7/1/2000
Authors: Kristine A Bertness, J T. Armstrong, Ryna B. Marinenko, Lawrence H Robins, Albert J. Paul, Joseph G. Pellegrino, Paul M. Amirtharaj, Deane Chandler-Horowitz
Abstract: We measure the composition of AlGaAs layers during epitaxial crystal growth using in situ normal-incidence optical reflectance supported by independent methods of measuring growth rate. The results are compared with conventional ex situ characterizat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26476

3. An EPMA Study of KNbO^d3^ and NaNbO^d3^ Single Crystals - Potential Reference Materials for Quantitative Microanalysis
Published: Date unknown
Authors: Z Samardzija, S Bernik, M Ceh, Ryna B. Marinenko, B Malic
Abstract: Single crystals of KNbO^d3^ and NaNbO^d3^ were selected from the limited number of suitable alkali compounds that are available and evaluated as possible reference materials for the electron-probe microanalysis (EPMA) of alkaline niobates with a comp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831308

4. Certification of K-411 glass microspheres with electron probe microanalysis
Published: 8/6/1995
Authors: S V. Roberson, Ryna B. Marinenko, J S Small, Douglas H. Blackburn, D Kauffman, Stefan D Leigh
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906527

5. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831299

6. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C k Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900913

7. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831283

8. Composition Standards for III-V Semiconductor Epitaxial Films
Published: 11/11/2002
Authors: Kristine A Bertness, Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L Salit
Abstract: A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibratio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30845

9. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831261

10. Dye Impregnation Method for Revealing Machining Crack Geometry
Published: 4/1/2000
Authors: Yasumitsu Matsuo, M. Sando, L K Ives, Ryna B. Marinenko, George David Quinn
Abstract: An observation technique for machining cracks in ceramics has been developed. Palladium (Pd) nitrate water solution was impregnated into a bending specimen using cold isostatic pressing. Following a failure test, crack geometry was determined from a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850341



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series