NIST logo

Publications Portal

You searched on: Author: ryna marinenko Sorted by: title

Displaying records 1 to 10 of 34 records.
Resort by: Date / Title

1. A Study of an Yttria-Doped-Zirconia Coating with Electron Microprobe Wavelength Dispersive Compositional Mapping
Published: 12/1/1997
Authors: Ryna B. Marinenko, David S. Bright, Eric B Steel

2. AlGaAs Composition Measurements from In Situ Optical Reflectance
Published: 7/1/2000
Authors: Kristine A Bertness, J T. Armstrong, Ryna B. Marinenko, Lawrence H Robins, Albert J. Paul, Joseph G. Pellegrino, Paul M. Amirtharaj, Deane Chandler-Horowitz
Abstract: We measure the composition of AlGaAs layers during epitaxial crystal growth using in situ normal-incidence optical reflectance supported by independent methods of measuring growth rate. The results are compared with conventional ex situ characterizat ...

3. An EPMA Study of KNbO^d3^ and NaNbO^d3^ Single Crystals - Potential Reference Materials for Quantitative Microanalysis
Published: Date unknown
Authors: Z Samardzija, S Bernik, M Ceh, Ryna B. Marinenko, B Malic
Abstract: Single crystals of KNbO^d3^ and NaNbO^d3^ were selected from the limited number of suitable alkali compounds that are available and evaluated as possible reference materials for the electron-probe microanalysis (EPMA) of alkaline niobates with a comp ...

4. Certification of K-411 glass microspheres with electron probe microanalysis
Published: 8/6/1995
Authors: S V. Roberson, Ryna B. Marinenko, J S Small, Douglas H. Blackburn, D Kauffman, Stefan D Leigh

5. Characterization of SiGe Bulk Compositional Standards with Electron Probe Microanalysis
Published: 9/1/2003
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Bulk SiGe wafers cut from single-crystal boules were evaluated with the electron probe microanalyzer (EPMA) for micro- and macroheterogeneity for use as primary standards for future characterization of SiGe thin films on Si that are needed by the mic ...

6. Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)
Report Number: 8905
Published: 2/1/2010
Authors: Ryna B. Marinenko, Shirley Turner, David S Simons, Savelas A Rabb, Rolf Louis Zeisler, Lee Lijian Yu, Dale E Newbury, Rick L Paul, Nicholas W m Ritchie, Stefan D Leigh, Michael R Winchester, Lee J Richter, Douglas C Meier, Keana C K Scott, D Klinedinst, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materi ...

7. Chemical Characterization of Silicon-Germanium Single Crystals - Initial Evaluation of the Extent of Heterogeneity
Published: 8/1/2002
Authors: Ryna B. Marinenko, J T. Armstrong, Shirley Turner, Eric B Steel, F A Stevie
Abstract: Initial heterogeneity testing with the electron microprobe using WDS of three SiGe wafers cut from single-crystal boules of different concentrations (nominally 3.5, 6.5, and 14 atomic % Ge) is described. Random and repeat samplings over the entire s ...

8. Composition Standards for III-V Semiconductor Epitaxial Films
Published: 11/11/2002
Authors: Kristine A Bertness, Lawrence H Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L Salit
Abstract: A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibratio ...

9. Compositional Homogeneity of Ferroelectric (Pb,La)(Ti,Zr)O-^d3^ Thick Films
Published: 2/1/2003
Authors: S Bernik, Ryna B. Marinenko, J Holc, Z Samardzija, M Ceh, M Kosec
Abstract: Quantified WDS x-ray element maps were used to characterize active PLZT layers on Pt/PLZT/Al^d2^O^d3^ substrates, one fired at 1050 C and the other at 1150 C. In the layer fired at 1050 C randomly distributed micrometer size compositional irregul ...

10. Dye Impregnation Method for Revealing Machining Crack Geometry
Published: 4/1/2000
Authors: Yasumitsu Matsuo, M. Sando, L K Ives, Ryna B. Marinenko, George David Quinn
Abstract: An observation technique for machining cracks in ceramics has been developed. Palladium (Pd) nitrate water solution was impregnated into a bending specimen using cold isostatic pressing. Following a failure test, crack geometry was determined from a ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series