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Author: ryna marinenko

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31. Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials
Published: Date unknown
Authors: Ryna B. Marinenko, Shirley Turner, Dale E Newbury, Robert L. Myklebust, Lee Lijian Yu, Rolf Louis Zeisler, David S Simons, John A Small
Abstract: Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics ind ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831405

32. NIST Certification of Metallurical Standard Reference Materials for Microanalysis - A Short History
Published: Date unknown
Author: Ryna B. Marinenko
Abstract: One page abstract.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831295

33. Optical and Structural Studies of Strain-Relaxed InxGa1-xN Films on GaN/sapphire with 0.04
Published: Date unknown
Authors: Lawrence H Robins, J T. Armstrong, Mark D Vaudin, Charles E. Bouldin, Joseph C Woicik, Albert J. Paul, W. Robert Thurber, Ryna B. Marinenko
Abstract: The structures of a set of InxGa1-xN films grown by atmospheric-pressure MOCVD onGaN buffer layers on c-plane sapphire, with compositions in the range 0.04 < x < 0.47, were characterized by x-ray diffraction (XRD). Several films were also examined by ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850413

34. Report from the NIST-MAS Workshop on The Accuracy Barrier in Quantitative EPMA and the Role of Standards
Published: Date unknown
Authors: Dale E Newbury, Ryna B. Marinenko, J T. Armstrong, John A Small, Eric B Steel
Abstract: stract is attached.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831292