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Author: ryna marinenko
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31. Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials
Ryna B. Marinenko, Shirley Turner, Dale E Newbury, Robert L. Myklebust, Lee Lijian Yu, Rolf Louis Zeisler, David S Simons, John A Small
Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics ind ...
32. NIST Certification of Metallurical Standard Reference Materials for Microanalysis - A Short History
Ryna B. Marinenko
One page abstract.
33. Optical and Structural Studies of Strain-Relaxed InxGa1-xN Films on GaN/sapphire with 0.04
Lawrence H Robins, J T. Armstrong, Mark D Vaudin, Charles E. Bouldin, Joseph C Woicik, Albert J. Paul, W. Robert Thurber, Ryna B. Marinenko
The structures of a set of InxGa1-xN films grown by atmospheric-pressure MOCVD onGaN buffer layers on c-plane sapphire, with compositions in the range 0.04 < x < 0.47, were characterized by x-ray diffraction (XRD). Several films were also examined by ...
34. Report from the NIST-MAS Workshop on The Accuracy Barrier in Quantitative EPMA and the Role of Standards
Dale E Newbury, Ryna B. Marinenko, J T. Armstrong, John A Small, Eric B Steel
stract is attached.