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Author: keith lykke

Displaying records 101 to 110 of 114 records.
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101. Microscopic Chemical Imaging with Laser Desorption Mass Spectrometry
Published: 1/1/1997
Authors: M R Savina, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104158

102. Sputtering Products of Sodium Sulfate: Implications for Io's Surface and for Sodium-Bearing Molecules in the Io torus
Published: 1/1/1997
Authors: R C Wiens, D S Burnett, W F Calaway, C S Hansen, Keith R Lykke, M J Pellin
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104805

103. Surface Mass Spectrometry of Biotinylated Self-assembled Monolayers
Published: 1/1/1997
Authors: J L Trevor, D E Mencer, Keith R Lykke, M J Pellin, L Hanley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=104230

104. Absolute Flux Calibrations of Stars
Published: Date unknown
Authors: Gerald T Fraser, Steven W Brown, Howard W Yoon, Bettye C Johnson, Keith R Lykke
Abstract: Absolute stellar photometry is based on 1970s terrestrial measurements of the star Vega referenced against the Cu fixed-point blackbody. Significant advances in absolute radiometry have been made in the last 30 years that offer the potential to impro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841110

105. Characterization of UV-Induced Radiation Damage to Si-based Photodiodes
Published: Date unknown
Authors: Keith R Lykke, Ping-Shine Shaw, J L Dehmer, R Gupta
Abstract: We have made direct measurements of the internal quantum efficiency and the reflectivity of UV-damaged silicon photodiodes in the spectral range of 120 nm to 320 nm. The above qualities, coupled with absolute spectral responsivities, give unique inf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841252

106. Compact Anamorphic Imaging Spectrometer
Published: Date unknown
Authors: P Maciejewski, K Barnard, Rand Swanson, Michael Kehoe, C Smith, Thomas Moon, Robert R. Bousquet, Steven W Brown, Keith R Lykke
Abstract: Deployment of compact hyperspectral imaging sensors on small UAVs has the potential of providing a cost-effective solution for rapid-response target detection and cueing based on time-critical spectral information collected at low altitudes. To addre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841073

107. Development of a Monochromatic Uniform Source Facility for Calibration of Radiance and Irradiance Detectors from 0.2 um to 12 um
Published: Date unknown
Authors: Keith R Lykke, Ping-Shine Shaw, Leonard M Hanssen, George P Eppeldauer
Abstract: A radiometric source facility is being constructed with narrow-band, widely tunable lasers from {difference} 200nm to 12 um. The output will be highly uniform and monochromatic. This facility will be used to make a wide variety of radiometric measu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840289

108. Spectral Irradiance Responsivity Measurements Between 1mu m and 5 mu m
Published: Date unknown
Authors: George P Eppeldauer, Joseph Paul Rice, Jun Zhang, Keith R Lykke
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841819

109. Spectral Irradiance and Radiance Responsivity Calibrations Using Uniform Sources (SIRCUS) Facility at NIST
Published: Date unknown
Authors: Steven W Brown, George P Eppeldauer, Joseph Paul Rice, Jun Zhang, Keith R Lykke
Abstract: Detectors have historically been calibrated for spectral power responsivity at the National Institute of Standards and Technology (NIST) using a lamp-monochromator system to tune the wavelength of the excitation source. Silicon detectors can be cali ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841840

110. System-Level Pre-Launch Calibration of Onboard Solar Diffusers
Published: Date unknown
Authors: R Barnes, Steven W Brown, Keith R Lykke, Gerald T Fraser, James J. Butler
Abstract: Onboard diffuse reflecting plaques are carried to orbit as radiometric reference standards for Earth-observing satellite instruments. For many instruments the reflectance properties of the plaque are characterized independent of the instrument, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841129



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