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Author: zachary levine
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Displaying records 1 to 10 of 103 records.
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1. A Bayesian approach to tomography of multiply scattered beams, ed. by A. Bouman, E.L. Miller and I. Pollack
Published: 1/1/2006
Author: Zachary H Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101825

2. A Low Cost Fiducial Reference for Computed Tomography
Published: 11/11/2008
Authors: Zachary H Levine, Steven E Grantham, Daniel S Sawyer, Anthony P Reeves, David F Yankelevitz
Abstract: Rationale and Objectives. To detect the growth in lesions, it is necessary to ensure that the apparent changes in size are above the noise floor of the system. By introducing a fiducial reference, it may be possible to detect smaller changes in le ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842437

3. A Low-Cost Density Reference Phantom for Computed Tomography
Published: 1/2/2009
Authors: Zachary H Levine, Ming-Dong Li, Anthony P Reeves, David F Yankelevitz, Joseph J Chen, Eliot L Siegel, Adele P Peskin, Diana N. Zeiger
Abstract: We have characterized a commercially-available polyurethane foam which is marketed for modeling parts in the aircraft, automotive, and related industries. We find that the foam may be suitable for use as a density reference standard in the range bel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842519

4. A Transmission X-Ray Microscope Based on Secondary-Electron Imaging,
Published: 1/1/1997
Authors: R N. Watts, S D Liang, Zachary H Levine, Thomas B Lucatorto, F Polack, M R Scheinfein
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101792

5. Ab Initio Calculations of Mean Free Paths and Stopping Powers
Published: 1/2/2006
Authors: A P Sorini, J. Kas, J J Rehr, M P Prange, Zachary H Levine
Abstract: An approach is presented for theortical calculations of inelastic losses in solids over a broad energy range. The method is based on a many-pole model dielectric function, which is derived from ab initio calculations of optical constants using a rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840241

6. Ab initio calculations of mean free paths and stopping powers,
Published: 1/1/2006
Authors: A P Sorini, J. Kas, J J Rehr, M P Prange, Zachary H Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101723

7. Accurate Pattern Registration for Integrated Circuit Tomography
Published: 7/1/2001
Authors: Zachary H Levine, S Grantham, S Neogi, S P Frigo, I McNulty, C C Retsch, Y Wang, Thomas B Lucatorto
Abstract: As part of an effort to develop high resolution microtomography for engineered structures, a two-level copper integrated circuit interconnect was imaged using 1.83 keV x-rays at 14 angles employing a full-field Fresnel zone plate microscope. A major ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840063

8. Accurate pattern registration for integrated circuit tomography
Published: 1/1/2001
Authors: Zachary H Levine, Steven E Grantham, S Neogi, S P Frigo, I McNulty, C C Retsch, Ying-ju Wang, Thomas B Lucatorto
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101603

9. Alignment of Fiducial Marks in a Tomographic Tilt Series with an Unknown Rotation Axis
Published: 4/1/2007
Authors: Zachary H Levine, Peter Volkovitsky, Howard Hung
Abstract: Alignment for tomography using a transmission electron microscopy frequently uses colloidal gold particles as fiducial reference marks. Typically, there is an implicit assumption that the tilt axis of the tomographic series is orthogonal to the beam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906668

10. An X-Ray Tomography Primer,
Published: 1/1/2005
Author: Zachary H Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101595



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