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Author: zachary levine

Displaying records 81 to 90 of 101 records.
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81. Calibration of High-Resolution X-Ray Tomography with Atomic Force Microscopy,
Series: Journal of Research (NIST JRES)
Published: 1/1/2000
Authors: A R Kalukin, B Winn, S S Wang, C Jacobsen, Zachary H Levine, Jing Fu
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101582

82. Microtomography of an integrated circuit interconnect with an electromigration void
Published: 1/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Ying-ju Wang, Uwe Arp, Thomas B Lucatorto, B D Ravel, Charles S Tarrio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101604

83. Methods to Remove Distortion Artifacts in Scanned Projections
Published: 7/1/1999
Authors: A R Kalukin, Zachary H Levine, Charles S Tarrio, S P Frigo, I McNulty, S S Wang, C C Retsch, M Kuhn, B Winn
Abstract: Atrifacts induced by distortions which sometimes occur in two-dimensional projection images can appear in the resulting tomographic reconstructions. We describe a procedure for analyzing, correcting and removing experimental atrifacts, and hence redu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840077

84. Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near Edge Spectroscopy
Published: 1/1/1999
Authors: Zachary H Levine, Bruce D Ravel
Abstract: Most integrated circuit interconnects are principally composed of a few metals, including aluminum alloyed with copper, tungsten, titanium, A1^d3^ Ti, and A1^d2^Cu, in a silica matrix. Integrated circuit interconnects have recently been proposed as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840009

85. Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy
Published: 1/1/1999
Authors: Zachary H Levine, B D Ravel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101606

86. Tomographic Reconstruction of an Integrated Circuit Interconnect
Published: 1/1/1999
Authors: Zachary H Levine, A R Kalukin, S P Frigo, I McNulty, M Kuhn
Abstract: An Al-W-silica integrated circuit interconnect sample was thinned to several micro {mu} and scanned across a 200 nm focal spot of a Fresnel zone plate operating at photon energy of 1573 eV. The experiment was performed on beamline 2-ID-B of the Adva ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840049

87. Tomographic Reconstruction of an Integrated Circuit Interconnect
Published: 1/1/1999
Authors: Zachary H Levine, A R Kalukin, S P Frigo, I McNulty, M Kuhn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101605

88. Magnetic Dichroism at the Giant Dipole Resonance of Fe and Mn Via Time-Dependent Density-Fuctional Theory
Published: 4/1/1998
Author: Zachary H Levine
Abstract: The polarization-resolved photoabsorption cross section has been calculated in the vicinity of the 3p--->3d giant dipole resonances of Fe [45-65 eV] and Mn 45-60 eV] using the relativisitic time-dependent local-spin-density approximation. The method ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840041

89. Effects of Feature Orientation in Tomographic Reconstructions, ed. by Ian McNulty
Published: 1/1/1998
Authors: A R Kalukin, Zachary H Levine, S P Frigo, I McNulty, M Kuhn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100165

90. Magnetic Dichroism at the Giant Dipole Resonance of Fe and Mn Via Time-Dependent Density-Functional Theory
Published: 1/1/1998
Author: Zachary H Levine
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101607



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