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1. A Rational Foundation for Software Metrology
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 8101
Published: 1/20/2016
Authors: David W Flater, Paul E Black, Elizabeth Nee nee Fong, Raghu N Kacker, Vadim Okun, Stephen S Wood, David R Kuhn
Abstract: Much software research and practice involves ostensible measurements of software, yet little progress has been made on an SI-like metrological foundation for those measurements since the work of Gray, Hogan, et al. in 1996-2001. Given a physical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919602

2. Measuring and Specifying Combinatorial Coverage of Test Input Configurations
Published: 11/14/2015
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: A key issue in testing is how many tests are needed for a required level of coverage or fault detection. Estimates are often based on error rates in initial testing, or on code coverage. For example, tests may be run until a desired level of stateme ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917142

3. Implementing and Managing Policy Rules in Attribute Based Access Control
Published: 8/13/2015
Authors: Chung Tong Hu, David F Ferraiolo, David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: Attribute Based Access Control (ABAC) is a popular approach to enterprise-wide access control that provides flexibility suitable for today's dynamic distributed systems. ABAC controls access to objects by evaluating policy rules against the attribute ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919151

4. Introducing Combinatorial Testing in a Large Organization
Published: 4/23/2015
Authors: Jon Hagar, Thomas Wissink, David R Kuhn, Raghu N Kacker
Abstract: A two-year study of eight pilot projects to introduce combinatorial testing in a large aerospace corporation found that the new methods were practical, significantly lowered development costs, and improved test coverage by 20 to 50 percent.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913242

5. Equivalence Class Verification and Oracle-Free Testing Using Two-layer Covering Arrays
Published: 4/17/2015
Authors: David R Kuhn, Raghu N Kacker, Yu Lei, Jose Torres-Jimenez
Abstract: This short paper introduces a method for verifying equivalence classes for module/unit testing. This is achieved using a two-layer covering array, in which some or all values of a primary covering array represent equivalence classes. A second layer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917899

6. Combinatorial Coverage as an Aspect of Test Quality
Published: 3/31/2015
Authors: David R Kuhn, Raghu N Kacker, Yu Lei
Abstract: There are relatively few good methods for evaluating test set quality, after ensuring basic requirements traceability. Structural coverage, mutation testing, and related methods can be used if source code is available, but these approaches may entai ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917352

7. IT Security
Published: 2/4/2015
Authors: Morris Chang, David R Kuhn, Timothy Weil
Abstract: How can IT professionals adapt to ever-changing security challenges quickly and without draining their organizations' resources? Articles in this issue highlight emerging trends and suggest ways to approach and address cybersecurity challenges. [gue ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917217

8. IT Pro Conference on Information Systems Governance
Published: 8/6/2014
Authors: Irena Bojanova, David R Kuhn
Abstract: Approximately 100 IT professionals participated in the 2014 IT Pro Conference on Information Systems Governance, held at the National Institute of Standards and Technology (NIST) on May 22, 2014 (www.computer.org/itproconf). Information systems gover ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916238

9. An Empirical Comparison of Combinatorial and Random Testing
Published: 4/4/2014
Authors: Raghu N Kacker, David R Kuhn
Abstract: Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915578

10. An Empirical Comparison of Combinatorial and Random Testing
Published: 4/1/2014
Authors: Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N Kacker, David R Kuhn
Abstract: Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915439



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