NIST logo

Publications Portal

You searched on: Author: john kramar

Displaying records 51 to 57.
Resort by: Date / Title


51. The Molecular Measuring Machine
Published: 1/1/1998
Authors: John A Kramar, E Gilsinn, E Amatucci, C Villarrubia, E Clayton Teague, W Scire, William B. Penzes
Abstract: To help meet the measurement needs of industries preparing to manufacture future generations of nanoelectronic devices and circuits, the National Institute of Standards and Technology (NIST) has designed and built an instrument¿called the Molecular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820127

52. Measurement of Patterned Film Linewidth for Interconnect Characterization
Published: 12/31/1995
Authors: Loren W. Linholm, Richard A Allen, Michael W. Cresswell, Rathindra Ghoshtagore, Santos D Mayo, Harry A. Schafft, John A Kramar, E Clayton Teague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16737

53. Measurement of Patterned Film Linewidth for Interconnect Characterization
Published: 1/1/1995
Authors: L Linholm, Robert Allen, Michael W. Cresswell, Rathindra Ghoshtagore, S Mayo, H Schafft, John A Kramar
Abstract: The results from high-quality electrical and physical measurements on the same cross-bridge resistor test structure with approximately vertical sidewalls have shown differences in linewidth as great as 90 nm for selected conductive films. These diffe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820744

54. Hertzian Contact Resonances
Published: 1/1/1994
Authors: John A Kramar, T Mcwaid, J Schneir, E Clayton Teague
Abstract: The resonant frequency of a sphere in contact with a flat surface was measured as a function of loading force for contacting materials with different elastic moduli. Comparisons were made with predictions based on the Hertzian theory of elastic defor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820686

55. Metrology Standards For Advanced Semiconductor Lithography Referenced to Atomic Spacings and Geometry
Published: 12/31/1993
Authors: E Clayton Teague, Loren W. Linholm, Michael W. Cresswell, William B. Penzes, John A Kramar, Fredric Scire, John S Villarrubia, Jay Shi Jun
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2653

56. Electronic Limitations in Phase Meters for Heterodyne Interferometry
Published: 7/1/1993
Authors: Nile M. Oldham, John A Kramar, P. S. Hetrick, E Clayton Teague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22814

57. Electronic Limitations in Phase Meters for Heterodyne Interferometry
Published: 10/1/1991
Authors: Nile M. Oldham, P. S. Hetrick, John A Kramar, William B. Penzes, T. Wheatley, E Clayton Teague
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=22839



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series