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You searched on: Author: robert keller

Displaying records 11 to 20 of 29 records.
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11. Transmission EBSD-Like Patterns in the SEM for Nanoparticle and Ultrathin Film Analysis
Published: 3/1/2012
Authors: Robert R Keller, Roy H. Geiss
Abstract: We describe a new high-resolution scanning electron microscope method for measuring crystallographic information in nanoparticles and ultrathin films with dimensions down to 10 nm, through use of an electron backscatter diffraction (EBSD) detector. B ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907049

12. Reliability Testing of Advanced Interconnect Materials
Published: 11/10/2011
Authors: Robert R Keller, Mark C Strus, Ann Chiaramonti Chiaramonti Debay, David Thomas Read, Younglae Kim, Yung Joon Jung
Abstract: We describe the development of electrical test methods to evaluate damage that determines reliability in advanced, small-scale conductors, including damascene copper and aligned carbon nanotube networks. Rapid thermal cycling induced during high-curr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908559

13. Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks
Published: 5/18/2011
Authors: Mark C Strus, Ann Chiaramonti Chiaramonti Debay, Robert R Keller, Yung Joon Jung, Younglae Kim
Abstract: We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907014

14. Electromigration of Cu Interconnects Under AC and DC Test Conditions
Published: 5/15/2011
Authors: Robert R Keller, David Thomas Read, Roey Shaviv, Greg Harm, Sangita Kumari
Abstract: Electromigration of a 65 nm technology generation test vehicle was measured using DC, AC followed by DC, and three rectangular wave DC stressing conditions at 598 K. In some of the experiments samples were allowed to cool to room temperature between ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906901

15. Electromigration of Cu Interconnects Under AC, Pulsed-DC and DC Test Conditions - Ramifications on Accelerated Testing
Published: 4/10/2011
Authors: Robert R Keller, David Thomas Read, Roey Shaviv, Greg Harm, Sangita Kumari
Abstract: Electromigration (EM) of a dual damascene, single-via fed, test vehicle was measured using DC, AC followed by DC, and three rectangular-wave DC stressing conditions at 598 K. In some of the experiments samples were allowed to cool between stress cyc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907877

16. Transmission Electron Diffraction from nanoparticles, nanowires and thin films in an SEM using conventional EBSD equipment
Published: 1/1/2010
Authors: Roy H. Geiss, Robert R Keller, David Thomas Read
Abstract: We describe a new scanning electron microscope (SEM) method for obtaining and analyzing the crystallographic structure and orientation in nanoparticles and ultrathin films using conventional electron backscatter diffraction (EBSD) equipment.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905080

17. Metrologies for Mechanical Response of Micro- and Nanoscale Systems
Published: 1/1/2008
Authors: Robert R Keller, Donna C. Hurley, David Thomas Read, Paul Rice
Abstract: This chapter describes metrologies developed by NIST scientists and collaborators for mechanical properties of dimensionally-constrained materials; these approaches make use of methods inherently sensitive to small volumes. Attention is focused on d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50654

18. Evaluation of Thin Film Mechanical Properties by Means of Electrical Test Methods
Published: 9/30/2007
Authors: Nicholas Barbosa, Robert R Keller, David Thomas Read, Richard P. Vinci
Abstract: The ability to measure the mechanical properties of thin films and small scale structures is essential in designing reliable components at the micro- and nano-scales. It is known that the mechanical properties of thin film materials deviate from rela ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50339

19. An Electrical Method for Measuring Fatigue and Tensile Properties of Thin Films on Substrates
Published: 8/15/2007
Authors: Robert R Keller, Nicholas Barbosa, Roy H. Geiss, David Thomas Read
Abstract: A novel approach for measuring thermal fatigue lifetime and ultimate strength of patterned thin films on substrates is presented. The method is based on controlled application of cyclic joule heating by means of low-frequency, high-density alternatin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50479

20. Report of the Workshop on Reliability Issues in Nanomaterials
Series: Special Publication (NIST SP)
Report Number: 1043
Published: 1/1/2007
Authors: Robert R Keller, David Thomas Read, Roop L Mahajan
Abstract: The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the U. S. Department of Commerce on August 17-19, 2004. It was organized by the National Institute of Standards and Technology (NIST) and was designed to pro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50180



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