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Author: terrence jach
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1. A UHV-Compatible Two-Crystal Monochromator for Synchrotron Radiation
Published: 12/1/1998
Authors: P L Cowan, J B Hastings, Terrence J Jach, J P Kirkland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100640

2. An X-Ray Monochromator Crystal Which Detects the Bragg Condition
Published: 5/1/1988
Authors: Terrence J Jach, Donald B. Novotny, G. P. Carver, Jon C Geist, R D Spal
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1570

3. Bulk and Surface Evidence for the Long Range Spatial Modulation of X-Ray Absorption in the AlPdMn Quasicrystal at Bragg Incidence
Published: 1/1/2001
Authors: G Cappello, A Dechelette, F Schmithusen, S Decossas, J Chevrier, F Comin, V Formoso, M. De Boissieu, Terrence J Jach, R. Colella, T Lograsso, C Jenks, D W Delaney
Abstract: An X-ray standing waves experiment was performed at the ID32 beam line of the ESRF on an Al-PD-Mn quasicrystal with the X-ray beam at normal incidence. The X-ray photoemission core levels for each element were recorded to probe the surface. The dra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831152

4. Characterization of Silicon-Oxynitride Dielectric Thin Films Using Grazing Incidence X-ray Photoelectron Spectroscopy
Published: 1/1/2001
Authors: E Landree, Terrence J Jach, D Brady, A. Karamcheti, J Canterbury, W Chism, A C Diebold
Abstract: To achieve the future goals for logic device dielectric film thickness and composition metrology, a set of well-characterized calibration reference material standards are needed for validating real-time diagnostic techniques used during production. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831214

5. Characterization of Ultrathin Silicon-Oxynitride Films Using Grazing Incidence X-Ray
Published: Date unknown
Authors: E Landree, Terrence J Jach
Abstract: This work describes the use of Grazing Incidence X-ray Photoemission Spectroscopy (GIXPS) to characterize the thickness of a silicon oxynitride ultrathin film. GIXPS utilizes the inherent optical and material properties of the film, along with the a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831585

6. Comparative Thickness Measurements of SiO^d2^/Si Films for Thickness Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A Dura, Nhan V Nguyen, J R. Swider, G Cappello, Curt A Richter
Abstract: We report on a comparative measurement of SiO^d2^/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831275

7. Comparative Thickness Measurements of SiO^d2^/Si Films for Thicknesses Less than 10 nm
Published: 1/1/2004
Authors: Terrence J Jach, Joseph A Dura, Nhan V Nguyen, J Swider, G Cappello, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31662

8. Controllable Catastrophe X-Ray Focusing
Published: Date unknown
Authors: S M Durbin, Terrence J Jach, S. Kim, V. Gopalan
Abstract: The interaction of waves with inhomogeneous media leads to the natural focusing of light, the channelling of waves into stable caustics such as the pattern of sunlight seen at the bottom of a rippled swimming pool. These effects are also found in sur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831451

9. Dynamical Diffraction and X-Ray Standing Waves from 2-Fold Reflections in the Quasicrystal AlPdMn
Published: 1/15/1998
Authors: Terrence J Jach, S. M. Thurgate, Y. Zhang, R. Colella, A. I. Goldman, S. Kycia, M. De Boissieu, M. Boudard
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903858

10. Dynamical Diffraction and X-Ray Standing Waves from Atomic Planes Normal in a Twofold Symmetry Axis of the Quasicrystal A1PdMn
Published: 4/1/1999
Authors: Terrence J Jach, Yanbao Zhang, R. Colella, M. De Boissieu, M. Boudard, A. I. Goldman, T Lograsso, D W Delaney, S. Kycia
Abstract: We have observed dynamical diffraction in the [024024] and[046046] reflections of the icosahedral quasicrystal A1PdMn in the back-reflection geometry ({theta}^dB^ = 90 ). The x-ray fluorescence from the Al and Pd atoms exhibits strong standing w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831075



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