NIST logo

Publications Portal

You searched on:
Author: lawrence hudson

Displaying records 11 to 20 of 84 records.
Resort by: Date / Title


11. Absolute measurements of x-ray backlighter sources at energies above 10 keVa)
Published: 2/1/2012
Authors: Lawrence T Hudson, B.R. Maddox, H.S. Parks, B A Remington, C. Chen, S Chen, S. T. Prisbrey, A. Comley, C A Back, C. Szabo, John F Seely, Uri Feldman, Stephen Michael Seltzer, M. J. Haugh, Z. Ali
Abstract: Line emission and broadband x-ray sources with x-ray energies above 10 keV have been investigated using a range of calibrated x-ray detectors for use as x-ray backlighters in high energy density (HED) experiments. The conversion efficiency of short- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908685

12. Pinhole X -ray camera photos of an ECR ion source plasma
Published: 11/1/2011
Authors: Lawrence T Hudson, Sandor Biri, E Takacs, R. Racz, J. Palinkas
Abstract: A 70 micrometer pinhole and an X-ray CCD camera in single photon counting mode were used to obtain spatially and spectral resolved images of an electron cyclotron resonance (ECR) ion source generated plasma. The method has good spatial resolution as ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907522

13. Energetic Photon Spectra from Targets Irradiated by Picoseconds Lasers
Published: 4/30/2011
Authors: Lawrence T Hudson, John F Seely, Csilla Szabo, Uri Feldman, Hui Chen, Albert Henins
Abstract: Photon spectra in the energy range 60 keV to 1 MeV were recorded from targets irradiated by the LLNL Titan and LLE EP picosecond lasers. The radiation consisted of K shell radiation, Bremsstrahlung radiation from MeV electrons, and preliminary eviden ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907778

14. Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range
Published: 4/15/2011
Authors: Lawrence T Hudson, C Michelle O'Brien, Uri Feldman, Stephen M. Seltzer, Hye-Sook Park, John F Seely
Abstract: Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow ba ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907535

15. Scaling studies with the dual crystal spectrometer at the OMEGA-EP laser facility
Published: 10/26/2010
Authors: Lawrence T Hudson, C.I Szabo, J. Workman, K. Flippo, Uri Feldman, Albert Henins
Abstract: The dual crystal spectrometer (DCS) is an approved diagnostic at the OMEGA and the OMEGA-EP laser facilities for the measurement of high energy x-rays in the 11 90 keV energy range, e.g., for verification of the x-ray spectrum of backlighter target ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907469

16. Asymmetrically cut crystal pair as x-ray magnifier for imaging at high intensity laser facilities.
Published: 10/20/2010
Authors: Lawrence T Hudson, Albert Henins, C.I Szabo, Uri Feldman, John F Seely, John J Curry
Abstract: The potential of an x-ray magnifier prepared from a pair of asymmetrically cut crystals is studied to explore high energy x-ray imaging capabilities at high intensity laser facilities. OMEGA-EP and NIF when irradiating mid and high Z targets can be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907468

17. Laser-produced MeV electrons and hard X-ray spectroscopic diagnostics
Published: 7/21/2010
Authors: Lawrence T Hudson, John F Seely
Abstract: A new spectroscopic technique for the measurement of the sizes of hard X-ray sources produced by the irradiation of solid-density targets by intense laser radiation is discussed. The technique is based on the source broadening of K shell spectral li ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907449

18. High contract femtosecond laser-driven intense hard X-ray source for imaging application
Published: 11/18/2009
Authors: Lawrence T Hudson, L.M Chen, W.M. Wang, M. Kando, F Liu, X.X. Lin, J.L Ma, Y.T. Li, S.V. Bulanvo, T. Tajima, Y. Kato, Z.M. Sheng, J Zhang
Abstract: In this report we address the current situation of laser-driven hard X-ray sources for imaging applications,especially the saturation of X-ray conversion efficiency and the serious impact upon imaging quality.By employing high contrast laser pulses ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907448

19. X-ray measurements at high-power lasers
Published: 5/1/2009
Authors: Lawrence T Hudson, C.I Szabo, Paul Indelicato, G.E. Gumberidze, G Holland, John F Seely, Albert Henins, M Audebert, S. Bastiani-Ceccotti, E. Tabakhoff, E. Brambrink
Abstract: Conversion efficiencies of laser light into K x-ray radiation are used to characterize laser-solid interactions e.g. in measurements with back-lighter targets in Inertial Confinement Fusion research or in ultra short x-ray science where ultra short l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842572

20. Analysis of ISCD-NIST Survey for Bone Health
Published: 4/1/2009
Authors: Andrew M Dienstfrey, Tammy L. Oreskovic, Herbert S Bennett, Lawrence T Hudson
Abstract: In 2007, the National Institute of Standards and Technology and the International Society for Clinical Densitometry designed a survey to prioritize seven research and standardization action items intended to improve accuracy and cross-comparability o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=890044



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series