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You searched on: Author: hui-min huang

Displaying records 31 to 40 of 71 records.
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31. Specifications for Intelligent Systems: How do they differ from those of Non-intelligent Ones?
Published: 12/4/2002
Authors: Elena R Messina, Hui-Min Huang
Abstract: A growing number of applications are utilizing so-called intelligent systems. As for any complex system, specifications are necessary for guiding the implementation, evaluating the performance and verifying the product. We examine the question of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822662

32. Second Workshop on Wireless Sensing Proceedings
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6930
Published: 11/1/2002
Authors: James D Gilsinn, Kang B Lee, Richard D Schneeman, Hui-Min Huang
Abstract: The second Workshop on Wireless Sensing was held on October 4, 2001, at the Sensors Expo & Conference at the Philadelphia Convention Center in Philadelphia, PA. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors Conf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821947

33. Software Engineering for Intelligent Control Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7095
Published: 11/1/2002
Authors: Tony Barbera, Elena R Messina, Hui-Min Huang, Craig I Schlenoff, Stephen B. Balakirsky
Abstract: Understanding how humans manage information and carry out actions provides a foundation for the software engineering of intelligent control systems. The Real-time Control System (RCS) design methodology and reference architecture, founded on human in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822483

34. 4D/RCS Version 2.0: A Reference Model Architecture for Unmanned Vehicle Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6910
Published: 8/22/2002
Authors: James S. Albus, Hui-Min Huang, Elena R Messina, Karl Murphy, Maris Juberts, Alberto Lacaze, Stephen B. Balakirsky, Michael O Shneier, Tsai Hong Hong, Harry A. Scott, Frederick M Proctor, William P Shackleford, John L Michaloski, Albert J. Wavering, Thomas Rollin Kramer, Nicholas G Dagalakis, William G Rippey, Keith A Stouffer, Steven Legowik
Abstract: The 4D/RCS architecture provides a reference model for military unmanned vehicles on how their software components should be identified, organized, and interacting such that missions, especially those involving unknown or hostile environments, can be ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821823

35. Distributed Testing of a Device-Level Interface Specification for a Metrology System
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6851
Published: 1/31/2002
Authors: Joseph A Falco, John A Horst, Hui-Min Huang, Thomas Rollin Kramer, Frederick M Proctor, Keith A Stouffer, Albert J. Wavering
Abstract: A test suite for an key interface within a dimensional measuring system (coordinate measuring machine or CMM) is presented. The test suite consists of test procedures, test definitions, and various testing utilities. A real-time, distributed test ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821682

36. An Intelligent Systems Architecture for Manufacturing (ISAM); A Reference Model Architecture for Intelligent Manufacturing Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6771
Published: 1/1/2002
Authors: James S. Albus, John A Horst, Hui-Min Huang, Thomas Rollin Kramer, Elena R Messina, Alex Meystel, John L Michaloski, Frederick M Proctor, Harry A. Scott, Edward J. Barkmeyer Jr., M. Kate Senehi
Abstract: The Intelligent Systems Architecture for Manufacturing (ISAM) addresses the application of intelligent systems to the manufacturing enterprise at three degrees of abstraction: 1) a conceptual framework for developing metrics, standards, and performan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821673

37. The First Workshop on Wireless Sensing Proceedings
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6823
Published: 1/1/2002
Authors: Kang B Lee, James D Gilsinn, Richard D Schneeman, Hui-Min Huang
Abstract: The First Wireless Sensing Workshop was held on June 4, 2001, at the Sensors Expo/Conference at the Rosemont Convention Center in Chicago, IL. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors Conference, and Instit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821854

38. A Feature-Based Inspection and Machining System
Published: 8/1/2001
Authors: Thomas Rollin Kramer, Hui-Min Huang, Elena R Messina, Frederick M Proctor, Harry A. Scott
Abstract: This paper describes an architecture for a system for machining and inspectingmechanical piece parts and an implementation of it called the Feature-BasedInspection and Control System (FBICS). In FBICS, the controller of a machiningcenter or coordinat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823382

39. First Workshop on Wireless Sensing
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6823
Published: 6/4/2001
Authors: Kang B Lee, James D Gilsinn, Richard D Schneeman, Hui-Min Huang
Abstract: The First Wireless Sensing Workshop was held on June 4, 2001, at the Sensors Expo/Conference at the Rosemont Convention Center in Chicago, IL. The National Institute of Standards and Technology (NIST), SENSORS magazine, Sensors Conference, and Insti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823306

40. Analysis of Dimensional Metrology Standards
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6847
Published: 6/1/2001
Authors: Thomas Rollin Kramer, John Evans, Simon Paul Frechette, John A Horst, Hui-Min Huang, Elena R Messina, Frederick M Proctor, William G Rippey, Harry A. Scott, Theodore Vincent Vorburger, Albert J. Wavering
Abstract: This is an analysis of standards related to dimensional metrology, with recommendations regarding standards development. The analysis focuses on the degree to which existing and developing standards provide a complete set of non-overlapping specifica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821714



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