NIST logo

Publications Portal

You searched on: Author: william guthrie

Displaying records 61 to 70 of 83 records.
Resort by: Date / Title


61. Effects of Hydrolytic Degradation on In Vitro Biocompatibility of Poly (d,l-lactic acid)
Published: 3/1/2002
Authors: S Yoneda, William F Guthrie, David S. Bright, C A Khatri, Francis W Wang
Abstract: Objective: In order to investigate the effects of hydrolytic degradation on the biocompatibility of poly (d,l-lactic acid) [P(d,l-LA], the initial attachment and the mitochondrial activity of MC3T3-El osteoblast-like cells on various degraded P(d,l-L ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851953

62. An alternative method for the certification of the sulfur mass fraction in coal Standard Reference Materials
Published: 6/1/2001
Authors: Michael R Winchester, William R. Kelly, Jacqueline L Mann, William F Guthrie, Bruce S MacDonald, Gregory C. Dr. (Gregory C.) Turk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904897

63. Using Inductively Coupled Plasma Mass Spectrometry for Calibration Transfer Between Environmental CRMs
Published: 6/1/2001
Authors: Gregory C. Dr. (Gregory C.) Turk, Lee Lijian Yu, Marc L Salit, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904888

64. Nanoindentation of Polymers: An Overview
Published: 3/1/2001
Authors: Mark R VanLandingham, John S Villarrubia, William F Guthrie, G Meyers
Abstract: Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=822454

65. Nanoindentation of Polymers: An Overview
Published: 1/1/2001
Authors: Mark R VanLandingham, John S Villarrubia, William F Guthrie, G Meyers
Abstract: In this paper, the application of instrumented indentation devices to the measurement of the elastic modulus of polymeric materials is reviewed. This review includes a summary of traditional analyses of load-penetration data and a discussion of assoc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821591

66. An Approach to Combining Results from Multiple Methods Motivated by the ISO GUM
Series: Journal of Research (NIST JRES)
Published: 8/1/2000
Authors: M Levenson, D L. Banks, K Eberhardt, L M. Gill, William F Guthrie, Hung-Kung Liu, M Vangel, James H Yen, Nien F Zhang
Abstract: The problem of determining a consensus value and its uncertainty from the results of multiple methods or laboratories is discussed. Desirable criteria of a solution are presented. A solution based on the ISO Guide to the Expression of Uncertainty i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151758

67. Nanoindentation of Polymers: An Overview
Published: 8/1/2000
Authors: Mark R VanLandingham, John S Villarrubia, William F Guthrie, G F Meyers
Abstract: Indentation measurements made with atomic force microscopy (AFM) probes are relative measurements, largely due to the lack of information regarding the tip shape of the AFM probes. Also, current tip shape calibration procedures used in depth-sensing ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=860259

68. Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors in Monocrystalline Films Having Non-Planar Geometries
Published: 5/1/1999
Authors: Michael W. Cresswell, Nadine Guillaume, Richard A Allen, William F Guthrie, Rathindra Ghoshtagore, James C. OwenI II, Z. Osborne, N. Sullivan, Loren W. Linholm
Abstract: This paper describes methods for the extraction of sheet resistance from V/I measurements made on four-terminal sheet resistors incorporated into electrical linewidth test structures patterned with non-planar geometries in monocrystalline silicon-on- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14902

69. Extraction of Sheet-Resistance from Four-Terminal Sheet Resistors in Monocrystalline Films Having Non-Planar Geometries
Published: 12/31/1998
Authors: Michael W. Cresswell, Nadine Guillaume, Richard A Allen, William F Guthrie, Rathindra Ghoshtagore, James C. OwenI II, Z. Osborne, N. Sullivan, Loren W. Linholm
Abstract: This paper describes methods for the extraction of sheet resistance from V/I measurements made on four-terminal sheet resistors incorporated into electrical linewidth test structures patterned with non-planar geometries in monocrystalline silicon-on- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28180

70. Intermittent-Contact Scanning Capacitance Microscopy Imaging and Modeling for Overlay Metrology
Published: 12/31/1998
Authors: Santos D Mayo, Joseph J Kopanski, William F Guthrie
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27867



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series