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Author: william guthrie

Displaying records 41 to 50 of 76 records.
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41. Effects of Hydrolytic Degradation on In Vitro Biocompatibility of Poly (d,l-lactic)
Published: 5/20/2003
Authors: S Yoneda, William F Guthrie, D S Bright, C A Khatri, F W Wang
Abstract: In order to investigate the effects of hydrolytic degradation on the biocompatibility of poly(d,l-lactic acid) [P(d,l-LA)], the initial attachment of MC3T3-E1 osteoblast-like cells on various degraded P(d,l-LA) disks was assessed. MC3T3-E1 cells wer ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50810

42. Combining Data in Small Multiple Method Studies
Published: 5/1/2003
Authors: Robert Charles Hagwood, William F Guthrie
Abstract: In this article an accurate confidence interval is derived when the results of a small number of different experimental methods are combined for the determination of an unknown quantity. ANOVA and a simple hierarchical Bayesian analysis of variance ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50796

43. Reference Material 8457, Ultra High Molecular Weight Polyethylene 0.5 cm Cubes
Published: 5/1/2003
Authors: B M Fanconi, J A Tesk, William F Guthrie
Abstract: The geometric and surface features of a new NIST reference material, RM 8457 are presented. This reference material is composed of Ultra High Molecular Weight Polyethylene (UHMWPE) in the form of 5 mm cubes. These cubes are intended for use in swell ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50795

44. Test Structures for Referencing Electrical Linewidth Measurements to Silicon Lattice Parameters Using HRTEM
Published: 5/1/2003
Authors: Richard A Allen, B A am Ende, Michael W Cresswell, Christine E. Murabito, T J. Headley, William F Guthrie, Loren W. Linholm, Colleen E. Hood, E. Hal Bogardus
Abstract: A technique has been developed to determine the linewidths of the features of a prototype reference material for the calibration of CD (Critical-Dimension) metrology instruments. The reference features are fabricated in mono-crystalline-silicon with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30085

45. Reference Material 8457, Ultra High Molecular Weight Polyethylene 0.5 cm Cubes
Published: 4/1/2003
Authors: B M Fanconi, John A Tesk, William F Guthrie
Abstract: The geometric and surface features of a new NIST reference material, RM 8457 are presented. This reference material is composed of Ultra High Molecular Weight Polyethylene (UHMWPE) in the form of 5 mm cubes. These cubesare intended for use in swelli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852105

46. Handbook 151: NIST/SEMATECH e-Handbook of Statistical Methods
Series: NIST Interagency/Internal Report (NISTIR)
Published: 11/1/2002
Authors: Nathanael A Heckert, James J Filliben, C M. Croarkin, B Hembree, William F Guthrie, P Tobias, J Prinz
Abstract: The URL is http://www.itl.nist.gov/div898/handbook/mpc/mpc.htm. This is a web based guide to statistical methods for engineering. It involves case studies with interactive software for analysis.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50798

47. CD Reference Materials for Sub-Tenth Micrometer Applications
Published: 6/1/2002
Authors: Michael W Cresswell, E. Hal Bogardus, Joaquin (Jack) Martinez, Marylyn H. Bennett, Richard A Allen, William F Guthrie, Christine E. Murabito, B A am Ende, Loren W. Linholm
Abstract: Prototype linewidth reference materials with Critical Dimensions (CDs) as narrow as 70 nm have been patterned in (110) silicon-on-insulator films. The sidewalls of the reference features are parallel, normal to the substrate surface, and have almost ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12043

48. Test Structures for Referencing Electronics Linewidth Measurements to Silicon Lattice Parameters Using HRTEM
Published: 4/8/2002
Authors: Richard A Allen, Michael W Cresswell, Christine E. Murabito, William F Guthrie, Loren W. Linholm, Colleen E. Hood, E. Hal Bogardus
Abstract: A technique has been developed to certify the linewidths of the features of a prototype reference materials for the calibration of CD (Critical-Dimension) metrology instruments. The reference features are fabricated in mono-crystalline-silicon with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8663

49. Measurement of the Linewidth of Electrical Test-Structure Reference Features By Automated Phase-Contrast Image Analysis
Published: 4/1/2002
Authors: B A am Ende, Michael W Cresswell, Richard A Allen, T J. Headley, William F Guthrie, Loren W. Linholm, E. Hal Bogardus, Christine E. Murabito
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30751

50. Measurement of the Linewidth of Electrical Test-Structure Reference Features by Automated Phase-Contrast Image Analysis
Published: 4/1/2002
Authors: B A am Ende, Michael W Cresswell, Richard A Allen, T J Headley, William F Guthrie, Loren W. Linholm, H Bogardus, Christine E. Murabito
Abstract: NIST, Sandia National Laboratories, and International SEMATECH are developing a new type of linewidth standard for calibrating Critical Dimension (CD) metrology instruments for lithographic process control. The standard reference feature is the bri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50975



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