NIST logo

Publications Portal

You searched on:
Author: martin green
Sorted by: date

Displaying records 1 to 10 of 30 records.
Resort by: Date / Title


1. Development of a Seebeck Coefficient Standard Reference Material (SRM),
Published: 8/1/2011
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Joshua Brooks Martin, Martin L Green, John E Bonevich, Evan L. Thomas, Neil Dilley, Jeff Sharp
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM,), Bi2Te3, that is essential for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using a differential stea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907792

2. Manipulation of crystallinity boundary via process space investigations of pulsed laser deposited high-k HfO2-TiO2-Y2O3 combinatorial thin films
Published: 3/10/2010
Authors: Jennifer L Klamo, Peter K. Schenck, Peter G. Burke, Kao-Shuo Chang, Martin L Green
Abstract: Combinatorial library films of HfO2-TiO2-Y2O3, a high-k dielectric system, grown by pulsed laser deposition, exhibit visible boundary lines separating amorphous and crystalline phases. By changing processing space parameters, specifically substrate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854456

3. RECENT INVESTIGATIONS OF Sr-Ca-Co-O THERMOELECTRIC MATERIALS
Published: 12/21/2009
Authors: Winnie K Wong-Ng, Guangyao Liu, Makoto Otani, Evan L. Thomas, Nathan Lowhorn, Martin L Green, James A. Kaduk
Abstract: Three low-dimension cobaltites in the Sr-Ca-Co-O system have been studied for their structure and thermoelectric properties. Using x-ray pole figure construction technique, a Ca3Co4O9 thin film showed excellent fiber texture but no ab in-plane textur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901376

4. Measurement of heat capacity and enthalpy of formation of Nickel Silicide using Nano-calorimetry
Published: 11/2/2009
Authors: Ravi Kummamuru, Lito De La Rama, Liang Hu, Mark D Vaudin, Mikhail Efremov, Martin L Green, David A LaVan, Leslie Allen
Abstract: We present characterization of energetics of the reaction between nickel and silicon thin films using differential scanning nano-calorimetry (nano-DSC). For the first time, nano-DSC measurements up to 850 °C and of enthalpy of thin film reactions hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902298

5. Development of a Seebeck Coefficient Standard Reference Material
Published: 8/7/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, John Lu, Evan L. Thomas, Makoto Otani, Martin L Green, Neil Dilley, Jeffrey Sharp, Thanh N. Tran
Abstract: We have successfully developed a Seebeck coefficient Standard Reference Material (SRM ), Bi2Te3, that is crucial for interlaboratory data comparison and for instrument calibration. Certification measurements were performed using two different techniq ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854458

6. Annealing Behavior of Atomic Layer Deposited HfO2 Films Studied by Synchrotron X-Ray Reflectivity and Grazing Incidence Small Angle Scattering
Published: 6/30/2009
Authors: Martin L Green, Andrew John Allen, J. L. Jordan-Sweet, Jan Ilavsky
Abstract: New results are presented for the annealing behavior of ultrathin complementary-metal-gate-semiconductor (CMOS) gate-dielectric (high-) HfO2 films grown by atomic layer deposition (ALD). A series of ALD HfO2 dielectric films has been stu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854475

7. Thermoelectric and Structural Characterization of Ba2Ho(Cu3-xCox)O6+y
Published: 6/13/2009
Authors: Winnie K Wong-Ng, Z Yang, Y F Hu, Qingzhen Huang, Nathan Lowhorn, Makoto Otani, James A Kaduk, Martin L Green, Q Li
Abstract: The search for thermoelectric materials for power generation and for solid-state cooling have led to the increased interest of layered cobalt-containing oxides because of their thermal stability at high temperature and their desirable thermoelectric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851090

8. A High-throughput Screening System for Thermoelectric Material Exploration Based on Combinatorial Film Approach
Published: 5/7/2009
Authors: Makoto Otani, Evan L. Thomas, Winnie K Wong-Ng, Peter K. Schenck, Nathan Lowhorn, Martin L Green, Hiroyuki Ohguchi
Abstract: A high-throughput system that consists of a combinatorial tool (a sputtering deposition tool and a pulsed laser deposition tool) and two property screening devices, developed at NIST, was used for thermoelectric material exploration. The thermoelectr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854167

9. Statistical analysis of a round-robin measurement survey of two candidate materials for a Seebeck coefficient Standard Reference Material
Published: 2/2/2009
Authors: John Lu, Nathan Lowhorn, Winnie K Wong-Ng, Weiping Zhang, Evan L. Thomas, Makoto Otani, Martin L Green, Thanh N. Tran, Chris Caylor, Neil Dilley, Adams Downey, B Edwards, Norbert Elsner, S Ghamaty, Timothy Hogan, Qing Jie, Qiang Li, Joshua Brooks Martin, George S. Nolas, H Obara, Jeffrey Sharp, Rama Venkatasubramanian, Rhonda Willigan, Jihui Yang, Terry Tritt
Abstract: In an effort to develop a Standard Reference Material (SRM ) for Seebeck coefficient, we have conducted a round-robin measurement survey of two candidate materials undoped Bi2Te3 and constantan (55% Cu and 45% Ni alloy). Measurements were performe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854434

10. Round-Robin Studies of Two Potential Seebeck Coefficient Standard Reference Materials
Published: 1/14/2009
Authors: Nathan Lowhorn, Winnie K Wong-Ng, Weiping Zhang, John Lu, Makoto Otani, Evan L. Thomas, Martin L Green, Thanh Tran
Abstract: The scientific activities of NIST include the development and distribution of standard reference materials (SRM) for instrument calibration and inter-laboratory data comparison. Full characterization of a thermoelectric material requires measurement ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851059



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series